14ZM

Crystal Structure of FtsZ with Z100643660

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-10
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.920051
Spacegroup name	P 65
Unit cell lengths	88.686, 88.686, 178.842
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	44.382 - 2.035
Rwork	0.186
R-free	0.22150
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.008
RMSD bond angle	1.675
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	44.343	2.070
High resolution limit [Å]	2.035	2.035
Rmerge	0.265	2.200
Rmeas	0.276	2.291
Rpim	0.076	0.638
Total number of observations	675885	32447
Number of reflections	50849	2520
<I/σ(I)>	8
Completeness [%]	100.0
Redundancy	13.3	12.9
CC(1/2)	0.996	0.356

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-779	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.