14ZK

Crystal Structure of FtsZ with Z45705015

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-10
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.920051
Spacegroup name	P 65
Unit cell lengths	88.485, 88.485, 179.657
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	42.996 - 2.366
Rwork	0.204
R-free	0.25740
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.007
RMSD bond angle	1.599
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	42.959	2.407
High resolution limit [Å]	2.366	2.366
Rmerge	0.516	2.719
Rmeas	0.538	2.854
Rpim	0.149	0.861
Total number of observations	421484	17724
Number of reflections	32419	1628
<I/σ(I)>	5.1
Completeness [%]	100.0
Redundancy	13	10.9
CC(1/2)	0.984	0.360

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-772	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.