14ZI

Crystal Structure of FtsZ with Z741055844

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-10
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.920051
Spacegroup name	P 65
Unit cell lengths	88.602, 88.602, 179.458
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	43.047 - 1.952
Rwork	0.180
R-free	0.21130
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.008
RMSD bond angle	1.723
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	43.010	1.986
High resolution limit [Å]	1.952	1.952
Rmerge	0.263	3.046
Rmeas	0.273	3.167
Rpim	0.075	0.864
Total number of observations	770322	38580
Number of reflections	57704	2873
<I/σ(I)>	7.9
Completeness [%]	100.0
Redundancy	13.3	13.4
CC(1/2)	0.996	0.351

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-761	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.