14ZH

Crystal Structure of FtsZ with Z28870646

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-10
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.920051
Spacegroup name	P 65
Unit cell lengths	88.273, 88.273, 177.585
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	42.870 - 2.099
Rwork	0.182
R-free	0.22000
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.007
RMSD bond angle	1.638
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	42.833	2.135
High resolution limit [Å]	2.099	2.099
Rmerge	0.280	1.938
Rmeas	0.291	2.023
Rpim	0.080	0.578
Total number of observations	609610	27783
Number of reflections	45676	2271
<I/σ(I)>	7.5
Completeness [%]	100.0
Redundancy	13.3	12.2
CC(1/2)	0.995	0.330

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-757	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.