14XV

Crystal Structure of FtsZ with Z27682767

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-07
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	88.139, 88.139, 177.787
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	44.108 - 1.971
Rwork	0.178
R-free	0.21580
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.008
RMSD bond angle	1.700
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	44.069	2.005
High resolution limit [Å]	1.971	1.971
Rmerge	0.216	3.161
Rmeas	0.226	3.295
Rpim	0.064	0.927
Total number of observations	687867	34389
Number of reflections	54969	2753
<I/σ(I)>	9.9
Completeness [%]	100.0
Redundancy	12.5	12.5
CC(1/2)	0.998	0.334

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-560	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.