14XU

Crystal Structure of FtsZ with Z822382694

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-07
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	88.434, 88.434, 178.648
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	44.256 - 1.909
Rwork	0.177
R-free	0.21360
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.008
RMSD bond angle	1.782
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	44.217	1.942
High resolution limit [Å]	1.909	1.909
Rmerge	0.227	3.370
Rmeas	0.237	3.513
Rpim	0.067	0.988
Total number of observations	757519	38218
Number of reflections	61251	3070
<I/σ(I)>	8.7
Completeness [%]	100.0
Redundancy	12.4	12.4
CC(1/2)	0.997	0.321

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-546	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.