14XT

Crystal Structure of FtsZ with Z1889787519

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-07
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	88.429, 88.429, 178.940
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	42.960 - 1.837
Rwork	0.181
R-free	0.21250
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.009
RMSD bond angle	1.740
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	42.924	1.869
High resolution limit [Å]	1.837	1.837
Rmerge	0.172	2.395
Rmeas	0.179	2.489
Rpim	0.049	0.677
Total number of observations	916221	46553
Number of reflections	68724	3434
<I/σ(I)>	10.8
Completeness [%]	100.0
Redundancy	13.3	13.6
CC(1/2)	0.999	0.360

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-544	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.