14XR

Crystal Structure of FtsZ with Z57515803

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-07
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	88.296, 88.296, 178.055
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	44.187 - 2.164
Rwork	0.179
R-free	0.22190
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.007
RMSD bond angle	1.537
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	44.148	2.201
High resolution limit [Å]	2.164	2.164
Rmerge	0.288	2.405
Rmeas	0.300	2.497
Rpim	0.081	0.668
Total number of observations	562869	28326
Number of reflections	41747	2064
<I/σ(I)>	8.7
Completeness [%]	99.9
Redundancy	13.5	13.7
CC(1/2)	0.994	0.333

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-540	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.