14XP

Crystal Structure of FtsZ with F2189-0570

This is a non-PDB format compatible entry.

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-03-29
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.920194
Spacegroup name	P 65
Unit cell lengths	88.851, 88.851, 179.927
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	43.167 - 1.995
Rwork	0.180
R-free	0.21150
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.008
RMSD bond angle	1.709
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	43.130	2.029
High resolution limit [Å]	1.995	1.995
Rmerge	0.172	2.244
Rmeas	0.179	2.334
Rpim	0.049	0.641
Total number of observations	726565	36085
Number of reflections	54565	2737
<I/σ(I)>	12
Completeness [%]	100.0
Redundancy	13.3	13.2
CC(1/2)	0.999	0.354

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-53	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.