14XO

Crystal Structure of FtsZ with Z71580604

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-07
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	87.884, 87.884, 177.561
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	43.981 - 2.156
Rwork	0.175
R-free	0.22750
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.007
RMSD bond angle	1.572
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	43.942	2.193
High resolution limit [Å]	2.156	2.156
Rmerge	0.230	2.510
Rmeas	0.241	2.627
Rpim	0.072	0.773
Total number of observations	471757	24036
Number of reflections	41753	2089
<I/σ(I)>	8.8
Completeness [%]	100.0
Redundancy	11.3	11.5
CC(1/2)	0.997	0.349

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-527	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.