14XM

Crystal Structure of FtsZ with Z415636694

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-07
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	88.164, 88.164, 178.082
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	44.121 - 2.017
Rwork	0.179
R-free	0.21720
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.008
RMSD bond angle	1.699
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	44.082	2.052
High resolution limit [Å]	2.017	2.017
Rmerge	0.268	3.349
Rmeas	0.279	3.484
Rpim	0.076	0.954
Total number of observations	686959	34068
Number of reflections	51452	2608
<I/σ(I)>	8.8
Completeness [%]	100.0
Redundancy	13.4	13.1
CC(1/2)	0.997	0.359

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-517	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.