14XL

Crystal Structure of FtsZ with Z33546965

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-07
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	88.426, 88.426, 179.273
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	42.964 - 2.100
Rwork	0.181
R-free	0.22180
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.007
RMSD bond angle	1.628
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	42.927	2.137
High resolution limit [Å]	2.100	2.100
Rmerge	0.265	2.403
Rmeas	0.275	2.508
Rpim	0.075	0.715
Total number of observations	617351	28044
Number of reflections	46114	2275
<I/σ(I)>	7.9
Completeness [%]	100.0
Redundancy	13.4	12.3
CC(1/2)	0.996	0.330

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-516	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.