14XJ

Crystal Structure of FtsZ with Z438067480

This is a non-PDB format compatible entry.

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-07
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	88.557, 88.557, 178.250
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	44.318 - 1.857
Rwork	0.183
R-free	0.21140
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.008
RMSD bond angle	1.741
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	44.278	1.889
High resolution limit [Å]	1.857	1.857
Rmerge	0.241	3.075
Rmeas	0.250	3.194
Rpim	0.068	0.859
Total number of observations	888313	45193
Number of reflections	66484	3336
<I/σ(I)>	8.1
Completeness [%]	100.0
Redundancy	13.4	13.5
CC(1/2)	0.997	0.334

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-512	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.