14XG

Crystal Structure of FtsZ with Z1147504955

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-07
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	88.203, 88.203, 177.700
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	44.140 - 1.899
Rwork	0.177
R-free	0.21090
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.008
RMSD bond angle	1.679
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	44.102	1.931
High resolution limit [Å]	1.899	1.899
Rmerge	0.183	2.520
Rmeas	0.190	2.619
Rpim	0.052	0.710
Total number of observations	821052	41576
Number of reflections	61579	3085
<I/σ(I)>	10.4
Completeness [%]	100.0
Redundancy	13.3	13.5
CC(1/2)	0.998	0.324

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-502	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.