14XF

Crystal Structure of FtsZ with Z31602870

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-07
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	88.740, 88.740, 178.803
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	44.409 - 1.839
Rwork	0.181
R-free	0.21320
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.009
RMSD bond angle	1.772
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	44.370	1.871
High resolution limit [Å]	1.839	1.839
Rmerge	0.173	2.610
Rmeas	0.180	2.712
Rpim	0.049	0.735
Total number of observations	921953	46720
Number of reflections	68941	3442
<I/σ(I)>	10.6
Completeness [%]	100.0
Redundancy	13.4	13.6
CC(1/2)	0.998	0.349

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-490	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.