14XC

Crystal Structure of FtsZ with Z108545814

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-07
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	88.445, 88.445, 178.908
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	42.967 - 1.759
Rwork	0.181
R-free	0.20840
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.009
RMSD bond angle	1.809
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	42.930	1.789
High resolution limit [Å]	1.759	1.759
Rmerge	0.188	3.962
Rmeas	0.195	4.115
Rpim	0.053	1.110
Total number of observations	1051600	53335
Number of reflections	78361	3900
<I/σ(I)>	9.2
Completeness [%]	100.0
Redundancy	13.4	13.7
CC(1/2)	0.998	0.351

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-485	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.