14WM
Crystal Structure of FtsZ with Z57299529
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | NSLS-II BEAMLINE 17-ID-1 |
| Synchrotron site | NSLS-II |
| Beamline | 17-ID-1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2025-04-06 |
| Detector | DECTRIS EIGER X 9M |
| Wavelength(s) | 0.919764 |
| Spacegroup name | P 65 |
| Unit cell lengths | 88.903, 88.903, 178.891 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 44.491 - 2.302 |
| Rwork | 0.179 |
| R-free | 0.22870 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.007 |
| RMSD bond angle | 1.595 |
| Data reduction software | autoPROC (1.0.5) |
| Data scaling software | Aimless |
| Phasing software | DIMPLE |
| Refinement software | REFMAC (5.8.0430) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 44.451 | 2.342 |
| High resolution limit [Å] | 2.302 | 2.302 |
| Rmerge | 0.373 | 3.631 |
| Rmeas | 0.388 | 3.777 |
| Rpim | 0.105 | 1.033 |
| Total number of observations | 476921 | 23594 |
| Number of reflections | 35370 | 1791 |
| <I/σ(I)> | 6.9 | |
| Completeness [%] | 100.0 | |
| Redundancy | 13.5 | 13.2 |
| CC(1/2) | 0.993 | 0.339 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| ftsz-426 | VAPOR DIFFUSION, SITTING DROP | 5 | 294 | 0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0. |






