14WA

Crystal Structure of FtsZ with Z85956652

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-06
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	88.782, 88.782, 180.209
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	43.140 - 1.942
Rwork	0.187
R-free	0.21910
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.008
RMSD bond angle	1.727
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	43.103	1.976
High resolution limit [Å]	1.942	1.942
Rmerge	0.230	2.040
Rmeas	0.241	2.135
Rpim	0.071	0.626
Total number of observations	677970	34466
Number of reflections	59092	2985
<I/σ(I)>	6.8
Completeness [%]	100.0
Redundancy	11.5	11.5
CC(1/2)	0.997	0.369

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-401	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.