14VU

Crystal Structure of FtsZ with Z45527714

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-06
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	87.742, 87.742, 176.642
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	43.910 - 2.436
Rwork	0.171
R-free	0.23040
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.007
RMSD bond angle	1.613
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	43.871	2.478
High resolution limit [Å]	2.436	2.436
Rmerge	0.378	2.704
Rmeas	0.393	2.810
Rpim	0.106	0.762
Total number of observations	389895	18968
Number of reflections	28724	1404
<I/σ(I)>	7.4
Completeness [%]	100.0
Redundancy	13.6	13.5
CC(1/2)	0.992	0.352

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-351	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.