14VJ

Crystal Structure of FtsZ with F3222-5456

This is a non-PDB format compatible entry.

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-07
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	88.356, 88.356, 177.715
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	44.217 - 1.979
Rwork	0.179
R-free	0.21120
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.008
RMSD bond angle	1.707
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	44.178	2.013
High resolution limit [Å]	1.979	1.979
Rmerge	0.239	2.544
Rmeas	0.248	2.645
Rpim	0.067	0.716
Total number of observations	726954	36481
Number of reflections	54575	2752
<I/σ(I)>	9
Completeness [%]	100.0
Redundancy	13.3	13.3
CC(1/2)	0.997	0.388

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-294	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.