ソフトウェア 名称 バージョン 分類 REFMAC5.8.0258精密化 HKL-2000データ削減 HKL-2000データスケーリング MOLREP位相決定
精密化 構造決定の手法 : 分子置換開始モデル : 1F8Q解像度 : 1.39→23.927 Å / Cor.coef. Fo :Fc : 0.965 / Cor.coef. Fo :Fc free : 0.954 / SU B : 2.379 / SU ML : 0.046 / 交差検証法 : FREE R-VALUE / ESU R : 0.067 / ESU R Free : 0.068 / 詳細 : Hydrogens have been added in their riding positionsRfactor 反射数 %反射 Rfree 0.2096 2265 5.022 % Rwork 0.1833 - - all 0.185 - - obs - 45100 94.943 %
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.2 Å原子変位パラメータ Biso mean : 22.826 Å2 Baniso -1 Baniso -2 Baniso -3 1- -0.447 Å2 -0.223 Å2 -0 Å2 2- - -0.447 Å2 0 Å2 3- - - 1.449 Å2
精密化ステップ サイクル : LAST / 解像度 : 1.39→23.927 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 1932 0 38 204 2174
拘束条件 大きな表を表示 (5 x 29) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.011 0.013 2042 X-RAY DIFFRACTION r_bond_other_d0.001 0.017 1923 X-RAY DIFFRACTION r_angle_refined_deg1.725 1.672 2788 X-RAY DIFFRACTION r_angle_other_deg1.516 1.584 4447 X-RAY DIFFRACTION r_dihedral_angle_1_deg5.871 5 253 X-RAY DIFFRACTION r_dihedral_angle_2_deg32.591 21.442 104 X-RAY DIFFRACTION r_dihedral_angle_3_deg12.191 15 340 X-RAY DIFFRACTION r_dihedral_angle_4_deg21.543 15 16 X-RAY DIFFRACTION r_chiral_restr0.086 0.2 279 X-RAY DIFFRACTION r_gen_planes_refined0.009 0.02 2279 X-RAY DIFFRACTION r_gen_planes_other0.002 0.02 435 X-RAY DIFFRACTION r_nbd_refined0.216 0.2 402 X-RAY DIFFRACTION r_symmetry_nbd_other0.177 0.2 1849 X-RAY DIFFRACTION r_nbtor_refined0.173 0.2 1044 X-RAY DIFFRACTION r_symmetry_nbtor_other0.081 0.2 913 X-RAY DIFFRACTION r_xyhbond_nbd_refined0.113 0.2 128 X-RAY DIFFRACTION r_symmetry_nbd_refined0.078 0.2 6 X-RAY DIFFRACTION r_nbd_other0.162 0.2 39 X-RAY DIFFRACTION r_symmetry_xyhbond_nbd_refined0.078 0.2 9 X-RAY DIFFRACTION r_mcbond_it1.209 2.006 1003 X-RAY DIFFRACTION r_mcbond_other1.201 2.004 1002 X-RAY DIFFRACTION r_mcangle_it1.761 3.011 1259 X-RAY DIFFRACTION r_mcangle_other1.761 3.013 1260 X-RAY DIFFRACTION r_scbond_it2.177 2.378 1039 X-RAY DIFFRACTION r_scbond_other2.178 2.377 1039 X-RAY DIFFRACTION r_scangle_it3.349 3.474 1529 X-RAY DIFFRACTION r_scangle_other3.348 3.475 1530 X-RAY DIFFRACTION r_lrange_it4.713 25.451 2347 X-RAY DIFFRACTION r_lrange_other4.712 25.45 2348
LS精密化 シェル 大きな表を表示 (7 x 20) 大きな表を隠す 解像度 (Å)Rfactor Rfree Num. reflection Rfree Rfactor Rwork Num. reflection Rwork Refine-ID % reflection obs (%)1.39-1.425 0.282 200 0.268 3256 X-RAY DIFFRACTION 98.7147 1.425-1.464 0.289 174 0.242 3242 X-RAY DIFFRACTION 99.883 1.464-1.506 0.227 173 0.225 3159 X-RAY DIFFRACTION 99.5221 1.506-1.553 0.227 167 0.204 3021 X-RAY DIFFRACTION 99.2528 1.553-1.604 0.22 154 0.186 2952 X-RAY DIFFRACTION 98.7914 1.604-1.66 0.204 146 0.184 2858 X-RAY DIFFRACTION 98.1058 1.66-1.722 0.21 138 0.181 2690 X-RAY DIFFRACTION 97.6857 1.722-1.793 0.176 111 0.178 2613 X-RAY DIFFRACTION 96.974 1.793-1.872 0.209 128 0.183 2498 X-RAY DIFFRACTION 96.1905 1.872-1.964 0.213 137 0.181 2277 X-RAY DIFFRACTION 94.0031 1.964-2.07 0.199 124 0.171 2174 X-RAY DIFFRACTION 93.6812 2.07-2.195 0.206 96 0.167 2055 X-RAY DIFFRACTION 92.6357 2.195-2.347 0.197 118 0.173 1906 X-RAY DIFFRACTION 92.674 2.347-2.534 0.195 98 0.171 1779 X-RAY DIFFRACTION 93.5693 2.534-2.776 0.21 85 0.171 1714 X-RAY DIFFRACTION 95.1348 2.776-3.103 0.186 73 0.186 1518 X-RAY DIFFRACTION 94.2536 3.103-3.581 0.243 60 0.179 1287 X-RAY DIFFRACTION 90.7682 3.581-4.383 0.171 34 0.167 933 X-RAY DIFFRACTION 76.6852 4.383-6.185 0.198 36 0.208 667 X-RAY DIFFRACTION 71.8814 6.185-10 0.378 13 0.276 236 X-RAY DIFFRACTION 46.4552
精密化 TLS 手法 : refined / Origin x : -0.7302 Å / Origin y : 24.0419 Å / Origin z : 0.0397 Å11 12 13 21 22 23 31 32 33 T 0.0179 Å2 -0.0047 Å2 0.009 Å2 - 0.0055 Å2 -0.0034 Å2 - - 0.0082 Å2 L 0.2442 °2 0.1935 °2 0.1123 °2 - 0.381 °2 0.1699 °2 - - 0.1831 °2 S 0.0021 Å ° -0.0269 Å ° 0.0209 Å ° -0.0276 Å ° -0.007 Å ° 0.0202 Å ° -0.0118 Å ° -0.0179 Å ° 0.0049 Å °
精密化 TLSグループ Selection : ALL