Type: DECTRIS EIGER X 16M / Detector: PIXEL / Date: Aug 15, 2016
Radiation
Protocol: SINGLE WAVELENGTH / Monochromatic (M) / Laue (L): M / Scattering type: x-ray
Radiation wavelength
Wavelength: 1 Å / Relative weight: 1
Reflection
Resolution: 2.95→80.12 Å / Num. obs: 39708 / % possible obs: 98 % / Redundancy: 6.7 % / Biso Wilson estimate: 65.4 Å2 / Net I/σ(I): 7
Reflection shell
Resolution: 2.95→2.96 Å / Redundancy: 7 % / Rmerge(I) obs: 1.75 / Mean I/σ(I) obs: 1.3 / CC1/2: 0.35 / % possible all: 98
-
Processing
Software
Name
Version
Classification
REFMAC
5.8.0155
refinement
XDS
datareduction
Aimless
datascaling
PHASER
phasing
Refinement
Resolution: 3→39.58 Å / Cor.coef. Fo:Fc: 0.923 / Cor.coef. Fo:Fc free: 0.888 / SU B: 63.13 / SU ML: 0.504 / Cross valid method: THROUGHOUT / ESU R Free: 0.459 / Stereochemistry target values: MAXIMUM LIKELIHOOD / Details: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
Num. reflection
% reflection
Selection details
Rfree
0.2653
1843
4.9 %
RANDOM
Rwork
0.2416
-
-
-
obs
0.2428
35724
98.2 %
-
Solvent computation
Ion probe radii: 0.8 Å / Shrinkage radii: 0.8 Å / VDW probe radii: 1.2 Å / Solvent model: MASK