解像度: 2.03→2.07 Å / 冗長度: 3.8 % / Mean I/σ(I) obs: 2.75 / Num. unique all: 8053 / Rsym value: 0.585 / % possible all: 97
-
解析
ソフトウェア
名称
バージョン
分類
HKL-3000
データ収集
PHASER
位相決定
PHENIX
(phenix.refine: 1.7.3_928)
精密化
HKL-3000
データ削減
HKL-3000
データスケーリング
精密化
構造決定の手法: molecular replacement/SAD / 解像度: 2.03→42.547 Å / SU ML: 0.19 / σ(F): 0 / 位相誤差: 21.36 / 立体化学のターゲット値: ML 詳細: THE PRESENCE IN THE ASYMMETRIC UNIT OF TWO PROTEINS WITH DISTINCT PATTERNS OF SIDE CHAIN MODIFICATION REPRESENTS THE BEST FIT TO THE ELECTRON DENSITY AND IS NOT DERIVED FROM THE CO- ...詳細: THE PRESENCE IN THE ASYMMETRIC UNIT OF TWO PROTEINS WITH DISTINCT PATTERNS OF SIDE CHAIN MODIFICATION REPRESENTS THE BEST FIT TO THE ELECTRON DENSITY AND IS NOT DERIVED FROM THE CO-CRYSTALLIZATION OF TWO CHEMICALLY DISTINCT PROTEINS.
Rfactor
反射数
%反射
Selection details
Rfree
0.2098
7469
5 %
RANDOM
Rwork
0.1707
-
-
-
obs
0.1726
149417
89.29 %
-
all
-
166830
-
-
溶媒の処理
減衰半径: 0.6 Å / VDWプローブ半径: 0.9 Å / 溶媒モデル: FLAT BULK SOLVENT MODEL / Bsol: 53.486 Å2 / ksol: 0.38 e/Å3
原子変位パラメータ
Biso mean: 36.11 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-1.6303 Å2
0 Å2
3.3484 Å2
2-
-
5.0352 Å2
0 Å2
3-
-
-
-3.4049 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.03→42.547 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
15806
0
96
1058
16960
拘束条件
Refine-ID
タイプ
Dev ideal
数
X-RAY DIFFRACTION
f_bond_d
0.01
16370
X-RAY DIFFRACTION
f_angle_d
0.988
22198
X-RAY DIFFRACTION
f_dihedral_angle_d
13.794
6144
X-RAY DIFFRACTION
f_chiral_restr
0.074
2396
X-RAY DIFFRACTION
f_plane_restr
0.004
2866
LS精密化 シェル
解像度 (Å)
Rfactor Rfree
Num. reflection Rfree
Rfactor Rwork
Num. reflection Rwork
Refine-ID
% reflection obs (%)
2.03-2.0533
0.2972
75
0.2255
1495
X-RAY DIFFRACTION
28
2.0533-2.0775
0.2425
109
0.2068
1985
X-RAY DIFFRACTION
38
2.0775-2.1028
0.276
140
0.2106
2404
X-RAY DIFFRACTION
46
2.1028-2.1295
0.2935
154
0.2226
3062
X-RAY DIFFRACTION
58
2.1295-2.1575
0.2472
190
0.2119
3819
X-RAY DIFFRACTION
72
2.1575-2.187
0.254
244
0.2108
4436
X-RAY DIFFRACTION
84
2.187-2.2183
0.2655
241
0.2154
4856
X-RAY DIFFRACTION
92
2.2183-2.2514
0.2466
259
0.2049
4949
X-RAY DIFFRACTION
94
2.2514-2.2866
0.2538
267
0.1965
5068
X-RAY DIFFRACTION
96
2.2866-2.324
0.2385
270
0.1904
5115
X-RAY DIFFRACTION
97
2.324-2.3641
0.2515
270
0.1983
5222
X-RAY DIFFRACTION
98
2.3641-2.4071
0.2305
292
0.1867
5107
X-RAY DIFFRACTION
98
2.4071-2.4534
0.2453
268
0.1899
5185
X-RAY DIFFRACTION
98
2.4534-2.5035
0.2476
262
0.1863
5228
X-RAY DIFFRACTION
98
2.5035-2.5579
0.2294
266
0.1889
5168
X-RAY DIFFRACTION
98
2.5579-2.6174
0.2281
283
0.1852
5165
X-RAY DIFFRACTION
99
2.6174-2.6828
0.2583
270
0.1823
5206
X-RAY DIFFRACTION
98
2.6828-2.7554
0.2369
262
0.1732
5251
X-RAY DIFFRACTION
99
2.7554-2.8364
0.2094
286
0.1734
5210
X-RAY DIFFRACTION
98
2.8364-2.928
0.2243
275
0.1703
5200
X-RAY DIFFRACTION
99
2.928-3.0326
0.1927
268
0.1643
5253
X-RAY DIFFRACTION
99
3.0326-3.154
0.218
284
0.165
5259
X-RAY DIFFRACTION
99
3.154-3.2975
0.1828
279
0.1525
5211
X-RAY DIFFRACTION
99
3.2975-3.4712
0.1945
278
0.1468
5257
X-RAY DIFFRACTION
99
3.4712-3.6886
0.1659
270
0.1428
5293
X-RAY DIFFRACTION
99
3.6886-3.9732
0.1819
271
0.1458
5239
X-RAY DIFFRACTION
99
3.9732-4.3727
0.185
285
0.1443
5305
X-RAY DIFFRACTION
99
4.3727-5.0046
0.1814
283
0.1448
5324
X-RAY DIFFRACTION
99
5.0046-6.3019
0.2019
275
0.1887
5337
X-RAY DIFFRACTION
99
6.3019-42.5558
0.2125
293
0.1944
5339
X-RAY DIFFRACTION
97
精密化 TLS
手法: refined / Origin x: 84.7848 Å / Origin y: 56.4114 Å / Origin z: -38.4891 Å