温度: 295 K / 手法: バッチ法 / pH: 4.7 詳細: HEWL co-crystallized with cisplatin and NAG in 7.5% DMSO media in 1 mL 10% sodium chloride + 1 ml 0.04 M sodium acetate, pH 4.7, BATCH, temperature 295K
-
データ収集
回折
平均測定温度: 295 K
放射光源
由来: 回転陽極 / タイプ: BRUKER AXS MICROSTAR / 波長: 1.5418 Å
検出器
タイプ: APEX II CCD / 検出器: CCD / 日付: 2012年1月24日
放射
モノクロメーター: confocal mirror optics / プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
解像度: 2.1→55.736 Å / Cor.coef. Fo:Fc: 0.961 / Cor.coef. Fo:Fc free: 0.916 / SU B: 8.478 / SU ML: 0.118 / 交差検証法: THROUGHOUT / σ(F): 4 / σ(I): 2 / ESU R: 0.21 / ESU R Free: 0.188 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS U VALUES : WITH TLS ADDED
Rfactor
反射数
%反射
Selection details
Rfree
0.22701
343
4.6 %
RANDOM
Rwork
0.15927
-
-
-
obs
0.16233
7050
99.99 %
-
all
-
13385
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 24.044 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.1 Å2
0 Å2
0 Å2
2-
-
-0.1 Å2
-0 Å2
3-
-
-
0.2 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.1→55.736 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1001
0
29
35
1065
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.018
0.019
1045
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
708
X-RAY DIFFRACTION
r_angle_refined_deg
2.531
1.918
1408
X-RAY DIFFRACTION
r_angle_other_deg
1.07
3.009
1685
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
7.096
5
128
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
39.27
23
50
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
15.313
15
166
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
25.586
15
11
X-RAY DIFFRACTION
r_chiral_restr
0.118
0.2
149
X-RAY DIFFRACTION
r_gen_planes_refined
0.008
0.02
1172
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
235
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
X-RAY DIFFRACTION
r_scbond_it
X-RAY DIFFRACTION
r_scangle_it
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.1→2.155 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.219
18
-
Rwork
0.159
432
-
obs
-
-
100 %
精密化 TLS
手法: refined / Origin x: -20.5662 Å / Origin y: -0.6539 Å / Origin z: -9.2676 Å