温度: 295 K / 手法: バッチ法 / pH: 4.7 詳細: HEWL co-crystallized with 150 mM excess N-acetylglucosamine in 1 mL 0.05 M sodium acetate and 1 mL 10% sodium chloride, pH 4.7, BATCH, temperature 295K
-
データ収集
回折
平均測定温度: 100 K
放射光源
由来: 回転陽極 / タイプ: RIGAKU MICROMAX-007 / 波長: 1.5418 Å
検出器
タイプ: RIGAKU RAXIS IV / 検出器: IMAGE PLATE / 日付: 2011年2月1日 / 詳細: Osmic Confocal Max-Flux, blue configuration
放射
モノクロメーター: confocal mirror optics / プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
解像度: 2.48→19.59 Å / Cor.coef. Fo:Fc: 0.936 / Cor.coef. Fo:Fc free: 0.881 / SU B: 24.161 / SU ML: 0.254 / 交差検証法: THROUGHOUT / σ(F): 4 / σ(I): 2 / ESU R Free: 0.415 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS U VALUES : REFINED INDIVIDUALLY
Rfactor
反射数
%反射
Selection details
Rfree
0.28508
164
4.5 %
RANDOM
Rwork
0.20018
-
-
-
obs
0.20401
3494
84 %
-
all
-
4120
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 29.955 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.15 Å2
-0 Å2
-0 Å2
2-
-
-0.15 Å2
-0 Å2
3-
-
-
0.3 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.48→19.59 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1001
0
15
23
1039
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.013
0.019
1040
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
716
X-RAY DIFFRACTION
r_angle_refined_deg
2.377
1.919
1410
X-RAY DIFFRACTION
r_angle_other_deg
0.953
3.009
1702
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
7.012
5
128
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
35.987
23
50
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
16.44
15
166
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
20.015
15
11
X-RAY DIFFRACTION
r_chiral_restr
0.085
0.2
149
X-RAY DIFFRACTION
r_gen_planes_refined
0.006
0.02
1177
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
236
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
X-RAY DIFFRACTION
r_scbond_it
X-RAY DIFFRACTION
r_scangle_it
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.48→2.543 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.736
7
-
Rwork
0.268
256
-
obs
-
-
100 %
精密化 TLS
手法: refined / Origin x: -20.3514 Å / Origin y: -0.9045 Å / Origin z: -8.9116 Å