解像度: 1.55→62.47 Å / Cor.coef. Fo:Fc: 0.957 / Cor.coef. Fo:Fc free: 0.939 / SU B: 3.179 / SU ML: 0.054 / 交差検証法: THROUGHOUT / ESU R: 0.091 / ESU R Free: 0.091 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.23797
1444
5.1 %
RANDOM
Rwork
0.20885
-
-
-
all
0.2103
-
-
-
obs
0.2103
27121
99.85 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 27.787 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.34 Å2
0 Å2
0 Å2
2-
-
0.22 Å2
0 Å2
3-
-
-
-0.56 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.55→62.47 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1403
0
18
138
1559
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.009
0.021
1449
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.217
1.957
1959
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
4.68
5
177
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
35.914
24.028
72
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
12.827
15
247
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
13.315
15
13
X-RAY DIFFRACTION
r_chiral_restr
0.08
0.2
212
X-RAY DIFFRACTION
r_gen_planes_refined
0.004
0.02
1109
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
0.206
0.2
657
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
0.305
0.2
993
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.148
0.2
138
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.241
0.2
33
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.129
0.2
16
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.969
1.5
909
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
1.526
2
1416
X-RAY DIFFRACTION
r_scbond_it
2.167
3
604
X-RAY DIFFRACTION
r_scangle_it
3.406
4.5
543
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.551→1.591 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.271
105
-
Rwork
0.251
1969
-
obs
-
-
99.38 %
精密化 TLS
手法: refined / Origin x: 14.9106 Å / Origin y: 18.0108 Å / Origin z: 45.6062 Å