モノクロメーター: SI(111) / プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 0.97945 Å / 相対比: 1
反射
解像度: 1.4→30 Å / Num. obs: 62696 / % possible obs: 98.6 % / 冗長度: 3.6 % / Rmerge(I) obs: 0.029 / Net I/σ(I): 40.3676
反射 シェル
解像度: 1.4→1.45 Å / 冗長度: 2.5 % / Rmerge(I) obs: 0.492 / Mean I/σ(I) obs: 1.697 / % possible all: 90.9
-
解析
ソフトウェア
名称
バージョン
分類
SnB
THENSOLVE/RESOLVE
位相決定
REFMAC
5.5.0102
精密化
DENZO
データ削減
SCALEPACK
データスケーリング
精密化
構造決定の手法: 単波長異常分散 / 解像度: 1.4→30 Å / Cor.coef. Fo:Fc: 0.97 / Cor.coef. Fo:Fc free: 0.962 / SU B: 1.858 / SU ML: 0.033 / 交差検証法: THROUGHOUT / ESU R Free: 0.059 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.19247
3176
5.1 %
RANDOM
Rwork
0.15867
-
-
-
obs
0.16034
59384
98.77 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 17.503 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.45 Å2
0 Å2
-0.08 Å2
2-
-
0.46 Å2
0 Å2
3-
-
-
0 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.4→30 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2409
0
4
332
2745
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.015
0.022
2442
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.527
1.978
3300
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
4.417
5
300
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
42.231
25.238
105
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.865
15
474
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
15.67
15
14
X-RAY DIFFRACTION
r_chiral_restr
0.215
0.2
405
X-RAY DIFFRACTION
r_gen_planes_refined
0.009
0.021
1742
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.632
1.5
1518
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
2.674
2
2466
X-RAY DIFFRACTION
r_scbond_it
4.291
3
924
X-RAY DIFFRACTION
r_scangle_it
6.391
4.5
834
X-RAY DIFFRACTION
r_rigid_bond_restr
1.935
3
2442
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.4→1.476 Å / Total num. of bins used: 10
Rfactor
反射数
%反射
Rfree
0.371
468
-
Rwork
0.331
8262
-
obs
-
-
94.92 %
精密化 TLS
手法: refined / Origin x: 13.3318 Å / Origin y: 13.3134 Å / Origin z: -7.6878 Å