| ソフトウェア | | 名称 | バージョン | 分類 |
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| SBC-Collect | | データ収集 | | HKL-3000 | | 位相決定 | | MLPHARE | | 位相決定 | | 直接法 | | モデル構築 | | SHELXD | | 位相決定 | | RESOLVE | | モデル構築 | | ARP/wARP | | モデル構築 | | REFMAC | 5.5.0017| 精密化 | | HKL-3000 | | データ削減 | | HKL-3000 | | データスケーリング | | 直接法 | | 位相決定 | | RESOLVE | | 位相決定 | |
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| 精密化 | 構造決定の手法: 単波長異常分散 / 解像度: 2.35→40.85 Å / Cor.coef. Fo:Fc: 0.955 / Cor.coef. Fo:Fc free: 0.929 / SU B: 15.384 / SU ML: 0.167 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.348 / ESU R Free: 0.241 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE
| Rfactor | 反射数 | %反射 | Selection details |
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| Rfree | 0.241 | 829 | 5.1 % | RANDOM |
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| Rwork | 0.194 | - | - | - |
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| obs | 0.196 | 16369 | 99.21 % | - |
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| 溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK |
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| 原子変位パラメータ | Biso mean: 39.88 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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| 1- | 0.48 Å2 | 0.24 Å2 | 0 Å2 |
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| 2- | - | 0.48 Å2 | 0 Å2 |
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| 3- | - | - | -0.72 Å2 |
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| 精密化ステップ | サイクル: LAST / 解像度: 2.35→40.85 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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| 原子数 | 2633 | 0 | 2 | 52 | 2687 |
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| 拘束条件 | | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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| X-RAY DIFFRACTION | r_bond_refined_d| 0.014 | 0.022 | 2699 | | X-RAY DIFFRACTION | r_bond_other_d| 0.002 | 0.02 | 1746 | | X-RAY DIFFRACTION | r_angle_refined_deg| 1.315 | 1.949 | 3670 | | X-RAY DIFFRACTION | r_angle_other_deg| 0.945 | 3 | 4239 | | X-RAY DIFFRACTION | r_dihedral_angle_1_deg| 6.935 | 5 | 344 | | X-RAY DIFFRACTION | r_dihedral_angle_2_deg| 35.8 | 23.277 | 119 | | X-RAY DIFFRACTION | r_dihedral_angle_3_deg| 14.32 | 15 | 403 | | X-RAY DIFFRACTION | r_dihedral_angle_4_deg| 16.587 | 15 | 20 | | X-RAY DIFFRACTION | r_chiral_restr| 0.074 | 0.2 | 416 | | X-RAY DIFFRACTION | r_gen_planes_refined| 0.006 | 0.021 | 3060 | | X-RAY DIFFRACTION | r_gen_planes_other| 0.002 | 0.02 | 564 | | X-RAY DIFFRACTION | r_nbd_refined | | | | X-RAY DIFFRACTION | r_nbd_other | | | | X-RAY DIFFRACTION | r_nbtor_refined | | | | X-RAY DIFFRACTION | r_nbtor_other | | | | X-RAY DIFFRACTION | r_xyhbond_nbd_refined | | | | X-RAY DIFFRACTION | r_xyhbond_nbd_other | | | | X-RAY DIFFRACTION | r_metal_ion_refined | | | | X-RAY DIFFRACTION | r_metal_ion_other | | | | X-RAY DIFFRACTION | r_symmetry_vdw_refined | | | | X-RAY DIFFRACTION | r_symmetry_vdw_other | | | | X-RAY DIFFRACTION | r_symmetry_hbond_refined | | | | X-RAY DIFFRACTION | r_symmetry_hbond_other | | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_refined | | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_other | | | | X-RAY DIFFRACTION | r_mcbond_it| 1.643 | 3 | 1718 | | X-RAY DIFFRACTION | r_mcbond_other| 0.439 | 3 | 700 | | X-RAY DIFFRACTION | r_mcangle_it| 2.981 | 5 | 2759 | | X-RAY DIFFRACTION | r_scbond_it| 5.718 | 8 | 981 | | X-RAY DIFFRACTION | r_scangle_it| 7.854 | 11 | 911 | | X-RAY DIFFRACTION | r_rigid_bond_restr | | | | X-RAY DIFFRACTION | r_sphericity_free | | | | X-RAY DIFFRACTION | r_sphericity_bonded | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | |
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| Refine LS restraints NCS | Refine-ID: X-RAY DIFFRACTION | Ens-ID | Dom-ID | Auth asym-ID | 数 | タイプ | Rms dev position (Å) | Weight position |
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| 1 | 1 | A| 58 | TIGHT POSITIONAL| 0.03 | 0.05 | | 1 | 1 | A| 64 | LOOSE POSITIONAL| 0.04 | 5 | | 1 | 2 | B| 58 | TIGHT THERMAL| 0.14 | 0.5 | | 1 | 2 | B| 64 | LOOSE THERMAL| 0.17 | 10 | | 2 | 1 | A| 298 | TIGHT POSITIONAL| 0.04 | 0.05 | | 2 | 1 | A| 340 | LOOSE POSITIONAL| 0.04 | 5 | | 2 | 2 | B| 298 | TIGHT THERMAL| 0.14 | 0.5 | | 2 | 2 | B| 340 | LOOSE THERMAL| 0.14 | 10 | | 3 | 1 | A| 56 | LOOSE POSITIONAL| 0.32 | 5 | | 3 | 1 | A| 56 | LOOSE THERMAL| 2.45 | 10 | | 4 | 1 | A| 171 | TIGHT POSITIONAL| 0.04 | 0.05 | | 4 | 1 | A| 198 | LOOSE POSITIONAL| 0.03 | 5 | | 4 | 2 | B| 171 | TIGHT THERMAL| 0.18 | 0.5 | | 4 | 2 | B| 198 | LOOSE THERMAL| 0.19 | 10 | | 5 | 1 | A| 15 | MEDIUM POSITIONAL| 0.13 | 0.5 | | 5 | 1 | A| 15 | MEDIUM THERMAL| 0.47 | 2 | | 6 | 1 | A| 177 | TIGHT POSITIONAL| 0.04 | 0.05 | | 6 | 1 | A| 194 | LOOSE POSITIONAL| 0.04 | 5 | | 6 | 2 | B| 177 | TIGHT THERMAL| 0.12 | 0.5 | | 6 | 2 | B| 194 | LOOSE THERMAL| 0.12 | 10 | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | |
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| LS精密化 シェル | 解像度: 2.35→2.41 Å / Total num. of bins used: 20
| Rfactor | 反射数 | %反射 |
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| Rfree | 0.278 | 58 | - |
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| Rwork | 0.202 | 1135 | - |
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| obs | - | - | 99.09 % |
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| 精密化 TLS | 手法: refined / Refine-ID: X-RAY DIFFRACTION | ID | L11 (°2) | L12 (°2) | L13 (°2) | L22 (°2) | L23 (°2) | L33 (°2) | S11 (Å °) | S12 (Å °) | S13 (Å °) | S21 (Å °) | S22 (Å °) | S23 (Å °) | S31 (Å °) | S32 (Å °) | S33 (Å °) | T11 (Å2) | T12 (Å2) | T13 (Å2) | T22 (Å2) | T23 (Å2) | T33 (Å2) | Origin x (Å) | Origin y (Å) | Origin z (Å) |
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| 1 | 0.7825 | -0.1541 | -0.2277 | 0.7267 | -0.0743 | 0.7124 | 0.0112 | 0.0842 | -0.0862 | 0.0298 | -0.0738 | -0.0418 | 0.0943 | 0.0076 | 0.0626 | 0.0243 | -0.031 | 0.0344 | 0.0787 | -0.0187 | 0.0896 | -12.707 | 23.11 | 21.73 | | 2 | 1.1649 | 0.2419 | 0.1397 | 0.9829 | 0.3079 | 0.5985 | -0.0727 | -0.1489 | -0.0759 | 0.2694 | 0.0371 | -0.2379 | 0.0285 | 0.0145 | 0.0356 | 0.0932 | -0.0039 | -0.0615 | 0.0897 | 0.0013 | 0.1081 | -5.448 | 33.994 | 45.604 |
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| 精密化 TLSグループ | | ID | Refine-ID | Refine TLS-ID | Auth asym-ID | Label asym-ID | Auth seq-ID | Label seq-ID |
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| 1 | X-RAY DIFFRACTION | 1 | AA| 1 - 173 | 1 - 173 | | 2 | X-RAY DIFFRACTION | 2 | BB| 1 - 173 | 1 - 173 | | | | |
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