ソフトウェア | 名称 | バージョン | 分類 | NB |
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SCALA | 3.2.25データスケーリング | | PHASER | | 位相決定 | | REFMAC | | 精密化 | | PDB_EXTRACT | 3.006 | データ抽出 | | MOSFLM | | データ削減 | | |
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精密化 | 構造決定の手法: 分子置換 開始モデル: PDB ENTRY 2A8D 解像度: 2.6→29.72 Å / Cor.coef. Fo:Fc: 0.944 / Cor.coef. Fo:Fc free: 0.923 / WRfactor Rfree: 0.232 / WRfactor Rwork: 0.211 / Occupancy max: 1 / Occupancy min: 1 / FOM work R set: 0.846 / SU B: 18.794 / SU ML: 0.186 / SU R Cruickshank DPI: 0.419 / SU Rfree: 0.267 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.409 / ESU R Free: 0.26 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.239 | 929 | 5.1 % | RANDOM |
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Rwork | 0.215 | - | - | - |
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obs | 0.216 | 18161 | 99.51 % | - |
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溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: BABINET MODEL WITH MASK |
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原子変位パラメータ | Biso max: 95.09 Å2 / Biso mean: 63.128 Å2 / Biso min: 40.02 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 0.04 Å2 | 0 Å2 | 0 Å2 |
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2- | - | 0.04 Å2 | 0 Å2 |
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3- | - | - | -0.09 Å2 |
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精密化ステップ | サイクル: LAST / 解像度: 2.6→29.72 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 2890 | 0 | 2 | 13 | 2905 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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X-RAY DIFFRACTION | r_bond_refined_d0.014 | 0.021 | 2960 | X-RAY DIFFRACTION | r_bond_other_d0.002 | 0.02 | 1954 | X-RAY DIFFRACTION | r_angle_refined_deg1.457 | 1.93 | 4014 | X-RAY DIFFRACTION | r_angle_other_deg0.866 | 3.002 | 4758 | X-RAY DIFFRACTION | r_dihedral_angle_1_deg7.28 | 5 | 362 | X-RAY DIFFRACTION | r_dihedral_angle_2_deg40.957 | 23.824 | 136 | X-RAY DIFFRACTION | r_dihedral_angle_3_deg19.161 | 15 | 508 | X-RAY DIFFRACTION | r_dihedral_angle_4_deg18.693 | 15 | 18 | X-RAY DIFFRACTION | r_chiral_restr0.071 | 0.2 | 456 | X-RAY DIFFRACTION | r_gen_planes_refined0.004 | 0.02 | 3268 | X-RAY DIFFRACTION | r_gen_planes_other0.001 | 0.02 | 598 | X-RAY DIFFRACTION | r_nbd_refined0.253 | 0.2 | 1069 | X-RAY DIFFRACTION | r_nbd_other0.224 | 0.2 | 2501 | X-RAY DIFFRACTION | r_nbtor_refined0.203 | 0.2 | 1565 | X-RAY DIFFRACTION | r_nbtor_other0.096 | 0.2 | 1723 | X-RAY DIFFRACTION | r_xyhbond_nbd_refined0.161 | 0.2 | 171 | X-RAY DIFFRACTION | r_xyhbond_nbd_other0.049 | 0.2 | 1 | X-RAY DIFFRACTION | r_symmetry_vdw_refined0.216 | 0.2 | 54 | X-RAY DIFFRACTION | r_symmetry_vdw_other0.3 | 0.2 | 63 | X-RAY DIFFRACTION | r_symmetry_hbond_refined0.205 | 0.2 | 6 | X-RAY DIFFRACTION | r_mcbond_it0.816 | 1.5 | 2236 | X-RAY DIFFRACTION | r_mcbond_other0.099 | 1.5 | 745 | X-RAY DIFFRACTION | r_mcangle_it1 | 2 | 2904 | X-RAY DIFFRACTION | r_scbond_it1.234 | 3 | 1326 | X-RAY DIFFRACTION | r_scangle_it1.856 | 4.5 | 1110 | | | | | | | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 2.6→2.667 Å / Total num. of bins used: 20
| Rfactor | 反射数 | %反射 |
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Rfree | 0.309 | 61 | - |
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Rwork | 0.271 | 1187 | - |
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all | - | 1248 | - |
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obs | - | - | 94.62 % |
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精密化 TLS | 手法: refined / Refine-ID: X-RAY DIFFRACTION ID | L11 (°2) | L12 (°2) | L13 (°2) | L22 (°2) | L23 (°2) | L33 (°2) | S11 (Å °) | S12 (Å °) | S13 (Å °) | S21 (Å °) | S22 (Å °) | S23 (Å °) | S31 (Å °) | S32 (Å °) | S33 (Å °) | T11 (Å2) | T12 (Å2) | T13 (Å2) | T22 (Å2) | T23 (Å2) | T33 (Å2) | Origin x (Å) | Origin y (Å) | Origin z (Å) |
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1 | 3.3012 | -0.4901 | -0.7619 | 1.9839 | -0.5313 | 2.2724 | 0.31 | 0.3203 | 0.0495 | -0.4815 | -0.2445 | -0.1938 | 0.2738 | 0.0665 | -0.0654 | 0.0542 | 0.0296 | 0.0772 | -0.1004 | 0.0465 | -0.0891 | 62.644 | 51.387 | 165.707 | 2 | 2.4277 | 0.4516 | 0.2703 | 3.1029 | -0.8507 | 2.5609 | 0.1656 | -0.2385 | -0.291 | -0.0086 | -0.0751 | -0.2966 | 0.4162 | 0.2165 | -0.0905 | -0.0434 | -0.0084 | -0.0394 | -0.1136 | 0.0728 | 0.0003 | 65.143 | 41.028 | 188.446 |
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精密化 TLSグループ | ID | Refine-ID | Refine TLS-ID | Auth asym-ID | Label asym-ID | Auth seq-ID | Label seq-ID |
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1 | X-RAY DIFFRACTION | 1 | AA34 - 215 | 34 - 215 | 2 | X-RAY DIFFRACTION | 2 | BB34 - 215 | 34 - 215 | | | | |
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