ソフトウェア 名称 バージョン 分類 REFMAC5.4.0073精密化 HKL-2000データ収集 HKL-2000データ削減 HKL-2000データスケーリング MOLREP位相決定
精密化 構造決定の手法 : 分子置換開始モデル : PDB entry 3DRX解像度 : 1.9→20 Å / Cor.coef. Fo :Fc : 0.958 / Cor.coef. Fo :Fc free : 0.939 / SU B : 7.421 / SU ML : 0.098 / TLS residual ADP flag : LIKELY RESIDUAL / 交差検証法 : THROUGHOUT / σ(F) : 0 / σ(I) : 0 / ESU R : 0.153 / ESU R Free : 0.142 / 立体化学のターゲット値 : MAXIMUM LIKELIHOODRfactor 反射数 %反射 Selection details Rfree 0.23226 2374 5.1 % RANDOM Rwork 0.19357 - - - all 0.19548 44550 - - obs 0.19548 44550 99.65 % -
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.2 Å / 溶媒モデル : BABINET MODEL WITH MASK原子変位パラメータ Biso mean : 40.152 Å2 Baniso -1 Baniso -2 Baniso -3 1- -0.46 Å2 0 Å2 0 Å2 2- - -2.62 Å2 0 Å2 3- - - 3.08 Å2
精密化ステップ サイクル : LAST / 解像度 : 1.9→20 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 4066 0 0 359 4425
拘束条件 大きな表を表示 (5 x 33) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.009 0.022 4176 X-RAY DIFFRACTION r_bond_other_dX-RAY DIFFRACTION r_angle_refined_deg1.196 1.983 5644 X-RAY DIFFRACTION r_angle_other_degX-RAY DIFFRACTION r_dihedral_angle_1_deg4.672 5 496 X-RAY DIFFRACTION r_dihedral_angle_2_deg28.715 23.333 210 X-RAY DIFFRACTION r_dihedral_angle_3_deg13.856 15 771 X-RAY DIFFRACTION r_dihedral_angle_4_deg21.825 15 40 X-RAY DIFFRACTION r_chiral_restr0.078 0.2 626 X-RAY DIFFRACTION r_gen_planes_refined0.005 0.021 3132 X-RAY DIFFRACTION r_gen_planes_otherX-RAY DIFFRACTION r_nbd_refinedX-RAY DIFFRACTION r_nbd_otherX-RAY DIFFRACTION r_nbtor_refinedX-RAY DIFFRACTION r_nbtor_otherX-RAY DIFFRACTION r_xyhbond_nbd_refinedX-RAY DIFFRACTION r_xyhbond_nbd_otherX-RAY DIFFRACTION r_metal_ion_refinedX-RAY DIFFRACTION r_metal_ion_otherX-RAY DIFFRACTION r_symmetry_vdw_refinedX-RAY DIFFRACTION r_symmetry_vdw_otherX-RAY DIFFRACTION r_symmetry_hbond_refinedX-RAY DIFFRACTION r_symmetry_hbond_otherX-RAY DIFFRACTION r_symmetry_metal_ion_refinedX-RAY DIFFRACTION r_symmetry_metal_ion_otherX-RAY DIFFRACTION r_mcbond_it0.938 1.5 2464 X-RAY DIFFRACTION r_mcbond_otherX-RAY DIFFRACTION r_mcangle_it1.677 2 3992 X-RAY DIFFRACTION r_scbond_it2.396 3 1712 X-RAY DIFFRACTION r_scangle_it3.814 4.5 1647 X-RAY DIFFRACTION r_rigid_bond_restrX-RAY DIFFRACTION r_sphericity_freeX-RAY DIFFRACTION r_sphericity_bonded
LS精密化 シェル 解像度 : 1.9→1.951 Å / Total num. of bins used : 20 Rfactor 反射数 %反射 Rfree 0.267 202 - Rwork 0.235 3090 - obs - - 98.42 %
精密化 TLS 手法 : refined / Refine-ID : X-RAY DIFFRACTION
大きな表を表示 (25 x 5) 大きな表を隠す ID L11 (°2 )L12 (°2 )L13 (°2 )L22 (°2 )L23 (°2 )L33 (°2 )S11 (Å °)S12 (Å °)S13 (Å °)S21 (Å °)S22 (Å °)S23 (Å °)S31 (Å °)S32 (Å °)S33 (Å °)T11 (Å2 )T12 (Å2 )T13 (Å2 )T22 (Å2 )T23 (Å2 )T33 (Å2 )Origin x (Å)Origin y (Å)Origin z (Å)1 1.7121 -0.8625 0.4768 2.566 -0.3026 2.1987 -0.0093 -0.249 -0.1785 0.2632 -0.0264 0.371 0.1995 -0.1113 0.0358 -0.0401 -0.0456 0.0192 -0.0425 0.0563 -0.0148 -14.2065 -10.4971 18.5026 2 1.6374 -0.0956 -0.1152 2.1979 0.2224 1.7467 0.0285 0.0864 0.077 -0.0855 0.0034 0.0974 -0.049 -0.126 -0.0318 -0.0699 0.0164 -0.0265 -0.0518 0.0165 -0.0512 -14.3966 7.3347 5.9032 3 2.1975 0.0155 -0.1435 2.2525 0.2279 1.2097 0.0665 0.1041 0.1074 -0.169 0.0194 -0.0652 -0.109 0.1124 -0.0859 -0.0228 -0.0187 0.0153 -0.0493 0.0196 -0.0745 6.451 10.9891 0.3067 4 2.3194 0.1766 0.5801 1.5414 -0.5813 2.1643 0.1291 -0.1981 -0.2865 0.0726 -0.0016 -0.1425 0.1917 0.0679 -0.1275 -0.0494 -0.01 -0.0176 -0.0411 0.0092 -0.029 18.8062 -3.7539 9.649 5 3.6367 0.0446 0.4015 2.0812 0.3682 2.2613 0.0616 0.1898 -0.0499 0.1175 -0.1228 -0.1812 0.0758 0.2849 0.0612 -0.0553 0.0508 -0.0293 0.0139 0.1417 -0.1423 5.9812 -17.0818 21.3861
精密化 TLSグループ ID Refine-ID Refine TLS-ID Auth asym-ID Auth seq-ID 1 X-RAY DIFFRACTION 1 A43 - 95 2 X-RAY DIFFRACTION 1 A96 - 145 3 X-RAY DIFFRACTION 1 A1001 - 1074 4 X-RAY DIFFRACTION 2 B43 - 95 5 X-RAY DIFFRACTION 2 B96 - 145 6 X-RAY DIFFRACTION 2 B1000 - 1089 7 X-RAY DIFFRACTION 3 C44 - 95 8 X-RAY DIFFRACTION 3 C96 - 145 9 X-RAY DIFFRACTION 3 C1008 - 1085 10 X-RAY DIFFRACTION 4 D43 - 95 11 X-RAY DIFFRACTION 4 D96 - 145 12 X-RAY DIFFRACTION 4 D1009 - 1078 13 X-RAY DIFFRACTION 5 E43 - 95 14 X-RAY DIFFRACTION 5 E96 - 145 15 X-RAY DIFFRACTION 5 E1001 - 1095