解像度: 1.8→19.86 Å / Cor.coef. Fo:Fc: 0.954 / Cor.coef. Fo:Fc free: 0.929 / WRfactor Rfree: 0.23 / WRfactor Rwork: 0.189 / SU B: 2.538 / SU ML: 0.082 / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.129 / ESU R Free: 0.127 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. Programs coot molprobity arp/warp have also been used in refinement.
Rfactor
反射数
%反射
Selection details
Rfree
0.233
2083
3.2 %
thin shells
Rwork
0.191
-
-
-
all
0.192
-
-
-
obs
0.192
64496
98.83 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 19.167 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.15 Å2
0 Å2
-0.35 Å2
2-
-
0.99 Å2
0 Å2
3-
-
-
-0.87 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.8→19.86 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
5110
0
61
361
5532
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.016
0.022
5257
X-RAY DIFFRACTION
r_bond_other_d
0.002
0.02
3447
X-RAY DIFFRACTION
r_angle_refined_deg
1.458
1.965
7149
X-RAY DIFFRACTION
r_angle_other_deg
0.958
3
8436
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.98
5
672
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
36.616
24.483
232
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.154
15
872
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
15.464
15
32
X-RAY DIFFRACTION
r_chiral_restr
0.087
0.2
830
X-RAY DIFFRACTION
r_gen_planes_refined
0.006
0.02
5879
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
1036
X-RAY DIFFRACTION
r_nbd_refined
0.203
0.2
922
X-RAY DIFFRACTION
r_nbd_other
0.196
0.2
3529
X-RAY DIFFRACTION
r_nbtor_refined
0.169
0.2
2484
X-RAY DIFFRACTION
r_nbtor_other
0.085
0.2
2716
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.124
0.2
280
X-RAY DIFFRACTION
r_metal_ion_refined
0.014
0.2
1
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.248
0.2
13
X-RAY DIFFRACTION
r_symmetry_vdw_other
0.251
0.2
66
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.108
0.2
18
X-RAY DIFFRACTION
r_mcbond_it
2.442
2
3464
X-RAY DIFFRACTION
r_mcbond_other
0.76
2
1360
X-RAY DIFFRACTION
r_mcangle_it
3.243
3
5353
X-RAY DIFFRACTION
r_scbond_it
2.879
2
2089
X-RAY DIFFRACTION
r_scangle_it
3.972
3
1789
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20