解像度: 2.98→3.09 Å / 冗長度: 2 % / Rmerge(I) obs: 0.372 / Mean I/σ(I) obs: 2 / Rsym value: 0.37 / % possible all: 47.5
反射
*PLUS
最高解像度: 3 Å / 最低解像度: 20 Å / % possible obs: 82.5 %
-
解析
ソフトウェア
名称
分類
X-PLOR
モデル構築
CNS
精密化
DENZO
データ削減
SCALEPACK
データスケーリング
X-PLOR
位相決定
精密化
構造決定の手法: 分子置換 / 解像度: 3→20 Å / Rfactor Rfree error: 0.015 / Data cutoff high absF: 525997.65 / Data cutoff low absF: 0 / 交差検証法: THROUGHOUT / σ(F): 0 詳細: TARGET FOR REFINEMENT WAS MLF: MAXIMUM LIKELIHOOD TARGET USING AMPLITUDES
Rfactor
反射数
%反射
Selection details
Rfree
0.324
510
10.9 %
RANDOM
Rwork
0.272
-
-
-
obs
0.272
4668
80.1 %
-
原子変位パラメータ
Biso mean: 83.5 Å2
Baniso -1
Baniso -2
Baniso -3
1-
10.54 Å2
18.91 Å2
0 Å2
2-
-
10.54 Å2
0 Å2
3-
-
-
-21.1 Å2
Refine analyze
Free
Obs
Luzzati coordinate error
0.74 Å
0.54 Å
Luzzati d res low
-
20 Å
Luzzati sigma a
0.8 Å
0.52 Å
精密化ステップ
サイクル: LAST / 解像度: 3→20 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
0
1295
14
4
1313
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
X-RAY DIFFRACTION
c_bond_d
0.007
X-RAY DIFFRACTION
c_bond_d_na
X-RAY DIFFRACTION
c_bond_d_prot
X-RAY DIFFRACTION
c_angle_d
X-RAY DIFFRACTION
c_angle_d_na
X-RAY DIFFRACTION
c_angle_d_prot
X-RAY DIFFRACTION
c_angle_deg
1.1
X-RAY DIFFRACTION
c_angle_deg_na
X-RAY DIFFRACTION
c_angle_deg_prot
X-RAY DIFFRACTION
c_dihedral_angle_d
29.7
X-RAY DIFFRACTION
c_dihedral_angle_d_na
X-RAY DIFFRACTION
c_dihedral_angle_d_prot
X-RAY DIFFRACTION
c_improper_angle_d
2.24
X-RAY DIFFRACTION
c_improper_angle_d_na
X-RAY DIFFRACTION
c_improper_angle_d_prot
X-RAY DIFFRACTION
c_mcbond_it
1.93
1.5
X-RAY DIFFRACTION
c_mcangle_it
3.18
2
X-RAY DIFFRACTION
c_scbond_it
1.92
2
X-RAY DIFFRACTION
c_scangle_it
3.21
2.5
LS精密化 シェル
解像度: 3→3.19 Å / Rfactor Rfree error: 0.07 / Total num. of bins used: 6
Rfactor
反射数
%反射
Rfree
0.502
47
5.1 %
Rwork
0.402
392
-
obs
-
-
47.6 %
Xplor file
Refine-ID
Serial no
Param file
Topol file
X-RAY DIFFRACTION
1
DNA-RNA-MULTI-ENDO.PARAM
DNA-RNA-MULTI-ENDO.TOP
X-RAY DIFFRACTION
2
MG.PARAM
MG.PARAM
X-RAY DIFFRACTION
3
PATCH.PAR
PATCH.PAR
精密化
*PLUS
最高解像度: 3 Å / 最低解像度: 20 Å / Num. reflection obs: 4950 / % reflection Rfree: 10.9 %