ENGINEERED RESIDUE IN CHAIN A, CYS 109 TO SER ENGINEERED RESIDUE IN CHAIN A, CYS 205 TO SER ...ENGINEERED RESIDUE IN CHAIN A, CYS 109 TO SER ENGINEERED RESIDUE IN CHAIN A, CYS 205 TO SER ENGINEERED RESIDUE IN CHAIN B, CYS 109 TO SER ENGINEERED RESIDUE IN CHAIN B, CYS 205 TO SER ENGINEERED RESIDUE IN CHAIN E, CYS 109 TO SER ENGINEERED RESIDUE IN CHAIN E, CYS 205 TO SER ENGINEERED RESIDUE IN CHAIN F, CYS 109 TO SER ENGINEERED RESIDUE IN CHAIN F, CYS 205 TO SER
解像度: 3.4→62.225 Å / SU ML: 0.43 / σ(F): 1.94 / 位相誤差: 29.65 / 立体化学のターゲット値: ML 詳細: B_SOL IS 102. NO SIGMA CUTOFF WAS APPLIED TO THE DATA. FULL ANOMALOUS DATA USED FOR FIT TO DATA STATISTICS.
Rfactor
反射数
%反射
Rfree
0.2823
1316
5 %
Rwork
0.2139
-
-
obs
0.217
25878
92.6 %
溶媒の処理
減衰半径: 0.83 Å / VDWプローブ半径: 1.1 Å / 溶媒モデル: FLAT BULK SOLVENT MODEL / Bsol: 99 Å2 / ksol: 0.258 e/Å3
原子変位パラメータ
Baniso -1
Baniso -2
Baniso -3
1-
-12.9817 Å2
0 Å2
0 Å2
2-
-
-12.9817 Å2
0 Å2
3-
-
-
25.9635 Å2
精密化ステップ
サイクル: LAST / 解像度: 3.4→62.225 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
7102
1736
2
0
8840
拘束条件
Refine-ID
タイプ
Dev ideal
数
X-RAY DIFFRACTION
f_bond_d
0.01
9435
X-RAY DIFFRACTION
f_angle_d
1.238
12753
X-RAY DIFFRACTION
f_dihedral_angle_d
19.484
3505
X-RAY DIFFRACTION
f_chiral_restr
0.065
1552
X-RAY DIFFRACTION
f_plane_restr
0.003
1334
Refine LS restraints NCS
Ens-ID
Dom-ID
Auth asym-ID
数
Refine-ID
タイプ
Rms dev position (Å)
1
1
B
1780
X-RAY DIFFRACTION
POSITIONAL
1
2
F
1780
X-RAY DIFFRACTION
POSITIONAL
0.014
2
1
A
1768
X-RAY DIFFRACTION
POSITIONAL
2
2
E
1768
X-RAY DIFFRACTION
POSITIONAL
0.008
LS精密化 シェル
解像度 (Å)
Rfactor Rfree
Num. reflection Rfree
Rfactor Rwork
Num. reflection Rwork
Refine-ID
% reflection obs (%)
3.4-3.5215
0.3659
220
0.3173
4104
X-RAY DIFFRACTION
84
3.5215-3.6625
0.3184
252
0.2868
4170
X-RAY DIFFRACTION
86
3.6625-3.8291
0.317
178
0.268
4366
X-RAY DIFFRACTION
89
3.8291-4.031
0.3243
259
0.2593
4460
X-RAY DIFFRACTION
91
4.031-4.2835
0.2951
276
0.2195
4485
X-RAY DIFFRACTION
92
4.2835-4.6141
0.2609
229
0.2077
4590
X-RAY DIFFRACTION
94
4.6141-5.0782
0.3251
235
0.2086
4691
X-RAY DIFFRACTION
96
5.0782-5.8126
0.2677
242
0.2071
4813
X-RAY DIFFRACTION
98
5.8126-7.3214
0.2648
228
0.1981
4942
X-RAY DIFFRACTION
100
7.3214-62.2356
0.2408
179
0.1857
4709
X-RAY DIFFRACTION
95
精密化 TLS
手法: refined / Origin x: -24.8937 Å / Origin y: 37.406 Å / Origin z: -34.9819 Å