解像度: 1.71→27.16 Å / Cor.coef. Fo:Fc: 0.916 / Cor.coef. Fo:Fc free: 0.876 / SU B: 6.58 / SU ML: 0.099 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / ESU R: 0.161 / ESU R Free: 0.16 立体化学のターゲット値: MAXIMUM LIKELIHOOD WITH PHASES 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.29149
1152
5.1 %
RANDOM
Rwork
0.23579
-
-
-
obs
0.23862
21573
84.03 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 22.761 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.02 Å2
-0.01 Å2
0 Å2
2-
-
-0.02 Å2
0 Å2
3-
-
-
0.03 Å2
Refine analyze
Free
Obs
Luzzati coordinate error
0.16 Å
0.161 Å
精密化ステップ
サイクル: LAST / 解像度: 1.71→27.16 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1683
0
7
161
1851
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.019
0.022
1764
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.76
1.982
2406
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.514
5
229
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
40.489
23.488
86
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
17.089
15
335
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
21.609
15
22
X-RAY DIFFRACTION
r_chiral_restr
0.137
0.2
296
X-RAY DIFFRACTION
r_gen_planes_refined
0.008
0.02
1309
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
0.246
0.2
984
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
0.305
0.2
1213
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.168
0.2
147
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.241
0.2
94
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.2
0.2
23
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.048
1.5
1125
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
1.535
2
1787
X-RAY DIFFRACTION
r_scbond_it
2.648
3
698
X-RAY DIFFRACTION
r_scangle_it
4.011
4.5
609
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.71→1.756 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.569
39
-
Rwork
0.418
919
-
obs
-
-
48.53 %
精密化 TLS
手法: refined / Origin x: -17.8004 Å / Origin y: 28.2732 Å / Origin z: -5.0842 Å