ジャーナル: J.Biol.Chem. / 年: 2006 タイトル: Further insight into S-adenosylmethionine-dependent methyltransferases: structural characterization of Hma, an enzyme essential for the biosynthesis of oxygenated mycolic acids in ...タイトル: Further insight into S-adenosylmethionine-dependent methyltransferases: structural characterization of Hma, an enzyme essential for the biosynthesis of oxygenated mycolic acids in Mycobacterium tuberculosis. 著者: Boissier, F. / Bardou, F. / Guillet, V. / Uttenweiler-Joseph, S. / Daffe, M. / Quemard, A. / Mourey, L.
履歴
登録
2006年1月4日
登録サイト: RCSB / 処理サイト: RCSB
改定 1.0
2006年1月17日
Provider: repository / タイプ: Initial release
改定 1.1
2008年5月1日
Group: Version format compliance
改定 1.2
2011年7月13日
Group: Advisory / Source and taxonomy / Version format compliance
解像度: 2.1→30 Å / Cor.coef. Fo:Fc: 0.95 / Cor.coef. Fo:Fc free: 0.928 / SU B: 8.445 / SU ML: 0.116 / TLS residual ADP flag: LIKELY RESIDUAL Isotropic thermal model: isotropic + anisotropic in the last stages of refinement (TLS parameters were refined using a single group) 交差検証法: THROUGHOUT / ESU R: 0.185 / ESU R Free: 0.165 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.23226
1173
5.2 %
RANDOM
Rwork
0.19546
-
-
-
all
0.19734
21535
-
-
obs
0.19734
21535
97.05 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 65.44 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.55 Å2
0.27 Å2
0 Å2
2-
-
0.55 Å2
0 Å2
3-
-
-
-0.82 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.1→30 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2218
0
0
124
2342
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.021
0.022
2271
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.736
1.953
3076
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.854
5
275
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
30.047
23.482
112
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.795
15
378
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
23.723
15
17
X-RAY DIFFRACTION
r_chiral_restr
0.132
0.2
333
X-RAY DIFFRACTION
r_gen_planes_refined
0.008
0.02
1749
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
0.211
0.2
1044
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
0.317
0.2
1564
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.123
0.2
139
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.111
0.2
37
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.235
0.2
7
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.176
1.5
1448
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
1.636
2
2227
X-RAY DIFFRACTION
r_scbond_it
2.788
3
972
X-RAY DIFFRACTION
r_scangle_it
3.95
4.5
849
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.1→2.154 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.26
86
-
Rwork
0.207
1570
-
obs
-
-
100 %
精密化 TLS
手法: refined / Origin x: 25.4802 Å / Origin y: 7.9661 Å / Origin z: 16.6698 Å