THE CONSTRUCT WAS EXPRESSED WITH A PURIFICATION TAG MGSDKIHHHHHHENLYFQG. THE TAG WAS REMOVED WITH ...THE CONSTRUCT WAS EXPRESSED WITH A PURIFICATION TAG MGSDKIHHHHHHENLYFQG. THE TAG WAS REMOVED WITH TEV PROTEASE LEAVING ONLY A GLYCINE (0) FOLLOWED BY THE TARGET SEQUENCE.
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実験情報
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実験
実験
手法: X線回折 / 使用した結晶の数: 1
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試料調製
結晶
マシュー密度: 2.37 Å3/Da / 溶媒含有率: 48.09 %
結晶化
温度: 277 K / pH: 6.3 詳細: 0.20M NH4NO3, 20.00% PEG-3350, No Buffer pH 6.3, NANODROP, VAPOR DIFFUSION, SITTING DROP, temperature 277K
解像度: 1.61→36.529 Å / Num. obs: 40969 / % possible obs: 99.7 % / Observed criterion σ(I): -3 / 冗長度: 3.582 % / Biso Wilson estimate: 16.25 Å2 / Rmerge(I) obs: 0.076 / Net I/σ(I): 11.86
反射 シェル
解像度: 1.61→1.67 Å / 冗長度: 3.6 % / Rmerge(I) obs: 0.63 / Mean I/σ(I) obs: 2.2 / % possible all: 99.9
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位相決定
位相決定
手法: 多波長異常分散
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解析
ソフトウェア
名称
バージョン
分類
NB
SHELX
位相決定
REFMAC
5.5.0109
精密化
XSCALE
データスケーリング
PDB_EXTRACT
3.1
データ抽出
XDS
データ削減
SHELXD
位相決定
autoSHARP
位相決定
精密化
構造決定の手法: 多波長異常分散 / 解像度: 1.61→36.53 Å / Cor.coef. Fo:Fc: 0.969 / Cor.coef. Fo:Fc free: 0.962 / Occupancy max: 1 / Occupancy min: 0.25 / SU B: 3.174 / SU ML: 0.055 / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.082 / ESU R Free: 0.081 立体化学のターゲット値: MAXIMUM LIKELIHOOD WITH PHASES 詳細: 1.HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. 2. A MET-INHIBITION PROTOCOL WAS USED FOR SELENOMETHIONINE INCORPORATION DURING PROTEIN EXPRESSION. THE OCCUPANCY OF THE SE ATOMS IN THE ...詳細: 1.HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. 2. A MET-INHIBITION PROTOCOL WAS USED FOR SELENOMETHIONINE INCORPORATION DURING PROTEIN EXPRESSION. THE OCCUPANCY OF THE SE ATOMS IN THE MSE RESIDUES WAS REDUCED TO 0.75 TO ACCOUNT FOR THE REDUCED SCATTERING POWER DUE TO PARTIAL S-MET INCORPORATION. 3. NITRATE (NO3) FROM THE CRYSTALLIZATION: CHLORIDE (CL) FROM THE PURIFICATION BUFFER; AND ETHYLENE GLYCOL(EDO), USED AS A CRYOPROTECTANT, WERE MODELED INTO THE STRUCTURE. 4. ATOM RECORD CONTAINS SUM OF TLS AND RESIDUAL B FACTORS. ANISOU RECORD CONTAINS SUM OF TLS AND RESIDUAL U FACTORS. 5.SOLVENT RESIDUES WERE EXCLUDED FROM TLS ASSIGNMENT.
Rfactor
反射数
%反射
Selection details
Rfree
0.182
2056
5 %
RANDOM
Rwork
0.155
-
-
-
obs
0.157
40912
99.8 %
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溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 21.02 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.88 Å2
0 Å2
0 Å2
2-
-
-0.46 Å2
0 Å2
3-
-
-
1.34 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.61→36.53 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2299
0
70
333
2702
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.016
0.022
2627
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
1799
X-RAY DIFFRACTION
r_angle_refined_deg
1.549
1.968
3593
X-RAY DIFFRACTION
r_angle_other_deg
0.853
3
4439
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.67
5
357
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
33.535
24.836
122
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.8
15
433
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
16.165
15
9
X-RAY DIFFRACTION
r_chiral_restr
0.093
0.2
389
X-RAY DIFFRACTION
r_gen_planes_refined
0.008
0.021
2981
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
520
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.655
1.5
1586
X-RAY DIFFRACTION
r_mcbond_other
0.182
1.5
626
X-RAY DIFFRACTION
r_mcangle_it
1.13
2
2578
X-RAY DIFFRACTION
r_scbond_it
1.882
3
1041
X-RAY DIFFRACTION
r_scangle_it
2.977
4.5
982
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.61→1.65 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.253
165
-
Rwork
0.246
2825
-
obs
-
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99.83 %
精密化 TLS
手法: refined / Origin x: 9.3263 Å / Origin y: 30.226 Å / Origin z: 14.628 Å