SHEET THE SHEET STRUCTURE OF THIS MOLECULE IS BIFURCATED. IN ORDER TO REPRESENT THIS FEATURE IN ... SHEET THE SHEET STRUCTURE OF THIS MOLECULE IS BIFURCATED. IN ORDER TO REPRESENT THIS FEATURE IN THE SHEET RECORDS BELOW, TWO SHEETS ARE DEFINED.
構造決定の手法: 多波長異常分散 / 解像度: 2→20 Å / Data cutoff high absF: 1000000 / Data cutoff low absF: 0.001 / Isotropic thermal model: RESTAINED / 交差検証法: THROUGHOUT / σ(F): 0 詳細: THE PROTEIN WAS PRODUCED IN A EUKARYOTIC EXPRESSION SYSTEM WHICH IS THEREFORE NOT FULLY SELENO-METHIONINE LABELLED SINCE THE EXACT COMPOSITION IS UNKNOWN, WE HAVE USED A CONSERVATIVE APPROACH ...詳細: THE PROTEIN WAS PRODUCED IN A EUKARYOTIC EXPRESSION SYSTEM WHICH IS THEREFORE NOT FULLY SELENO-METHIONINE LABELLED SINCE THE EXACT COMPOSITION IS UNKNOWN, WE HAVE USED A CONSERVATIVE APPROACH IN REFINEMENT AND TREATED THE RESIDUES AS STANDARD METHIONINE RESIDUES ALLOWING B FACTORS TO COMPENSATE FOR OCCUPANCY.
Rfactor
反射数
%反射
Selection details
Rfree
0.27
5440
5 %
RANDOM
Rwork
0.206
-
-
-
obs
0.206
107917
96.7 %
-
精密化ステップ
サイクル: LAST / 解像度: 2→20 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
9828
0
0
841
10669
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
X-RAY DIFFRACTION
x_bond_d
0.007
X-RAY DIFFRACTION
x_bond_d_na
X-RAY DIFFRACTION
x_bond_d_prot
X-RAY DIFFRACTION
x_angle_d
X-RAY DIFFRACTION
x_angle_d_na
X-RAY DIFFRACTION
x_angle_d_prot
X-RAY DIFFRACTION
x_angle_deg
1.4
X-RAY DIFFRACTION
x_angle_deg_na
X-RAY DIFFRACTION
x_angle_deg_prot
X-RAY DIFFRACTION
x_dihedral_angle_d
28.8
X-RAY DIFFRACTION
x_dihedral_angle_d_na
X-RAY DIFFRACTION
x_dihedral_angle_d_prot
X-RAY DIFFRACTION
x_improper_angle_d
0.68
X-RAY DIFFRACTION
x_improper_angle_d_na
X-RAY DIFFRACTION
x_improper_angle_d_prot
X-RAY DIFFRACTION
x_mcbond_it
4.3
2
X-RAY DIFFRACTION
x_mcangle_it
6.3
3
X-RAY DIFFRACTION
x_scbond_it
7
3
X-RAY DIFFRACTION
x_scangle_it
9.5
3.5
LS精密化 シェル
解像度: 2→2.09 Å / Total num. of bins used: 8
Rfactor
反射数
%反射
Rfree
0.392
589
5 %
Rwork
0.342
11156
-
Xplor file
Refine-ID
Serial no
Param file
Topol file
X-RAY DIFFRACTION
1
PROTEIN-REP.PARAM
TOPHCSDX.PRO
X-RAY DIFFRACTION
2
TOPH11.WAT
精密化
*PLUS
最高解像度: 2 Å / 最低解像度: 20 Å / % reflection Rfree: 5 %