% possible obs: 95.3 % / Rmerge(I) obs: 0.196 / Mean I/σ(I) obs: 3.5
-
解析
ソフトウェア
名称
バージョン
分類
DENZO
データ削減
SCALEPACK
データスケーリング
RESOLVE
モデル構築
SOLVE
位相決定
ARP/wARP
モデル構築
REFMAC
5.1.955
精密化
RESOLVE
位相決定
精密化
構造決定の手法: 多波長異常分散 / 解像度: 1.6→48.18 Å / Cor.coef. Fo:Fc: 0.974 / Cor.coef. Fo:Fc free: 0.956 / SU B: 2.507 / SU ML: 0.041 / TLS residual ADP flag: LIKELY RESIDUAL / Isotropic thermal model: Isotropic / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.067 / ESU R Free: 0.075 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: WEAK CONTINUOUS DIFFERENCE DENSITY AT THE N-TERMINUS WAS MODELLED AS HIS-TAG RESIDUES, BUT AT HALF OCCUPANCY.THE CONTINUED PRESENCE OF SPURIOUS DIFFERENCE DENSITY IMPLIES THAT THIS STILL IS ...詳細: WEAK CONTINUOUS DIFFERENCE DENSITY AT THE N-TERMINUS WAS MODELLED AS HIS-TAG RESIDUES, BUT AT HALF OCCUPANCY.THE CONTINUED PRESENCE OF SPURIOUS DIFFERENCE DENSITY IMPLIES THAT THIS STILL IS AN INCOMPLETE DESCRIPTION OF THE N-TERMINUS. XFIT/CCP4/TLS WAS ALSO USED IN REFINEMENT.
Rfactor
反射数
%反射
Selection details
Rfree
0.18
1926
5.1 %
RANDOM
Rwork
0.139
-
-
-
obs
0.141
36027
97.8 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 13.32 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0 Å2
0 Å2
0 Å2
2-
-
0.06 Å2
0 Å2
3-
-
-
-0.06 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.6→48.18 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1831
0
1
422
2254
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.012
0.021
1909
X-RAY DIFFRACTION
r_bond_other_d
0.002
0.02
1796
X-RAY DIFFRACTION
r_angle_refined_deg
1.411
1.969
2571
X-RAY DIFFRACTION
r_angle_other_deg
0.882
3
4177
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.079
5
225
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
34.05
24.124
97
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
10.828
15
376
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
19.046
15
15
X-RAY DIFFRACTION
r_chiral_restr
0.091
0.2
296
X-RAY DIFFRACTION
r_gen_planes_refined
0.006
0.02
2072
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
390
X-RAY DIFFRACTION
r_nbd_refined
0.211
0.2
383
X-RAY DIFFRACTION
r_nbd_other
0.238
0.2
2207
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
0.08
0.2
1177
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.23
0.2
248
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
0.115
0.2
3
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.306
0.2
15
X-RAY DIFFRACTION
r_symmetry_vdw_other
0.336
0.2
48
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.244
0.2
45
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_mcbond_it
1.79
4
1129
X-RAY DIFFRACTION
r_mcangle_it
3.054
6
1841
X-RAY DIFFRACTION
r_scbond_it
4.411
10
780
X-RAY DIFFRACTION
r_scangle_it
6.905
13
730
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.6→1.64 Å / Total num. of bins used: 20 /
Rfactor
反射数
Rfree
0.218
137
Rwork
0.165
2413
精密化 TLS
手法: refined / Origin x: 20.0943 Å / Origin y: 8.3707 Å / Origin z: 2.9538 Å