ソフトウェア | 名称 | バージョン | 分類 |
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X-PLOR | 3.1 | モデル構築 | PROLSQ | | 精密化 | X-PLOR | 3.1 | 精密化 | WEIS | | データ削減 | X-PLOR | 3.1 | 位相決定 |
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精密化 | 解像度: 2.7→6 Å / σ(F): 2 / | Rfactor | 反射数 |
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Rwork | 0.24 | - |
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obs | 0.24 | 17433 |
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原子変位パラメータ | Biso mean: 35.41 Å2 |
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Refine analyze | Luzzati coordinate error obs: 0.4 Å |
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精密化ステップ | サイクル: LAST / 解像度: 2.7→6 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 3748 | 0 | 188 | 61 | 3997 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target |
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X-RAY DIFFRACTION | x_bond_d0.01 | | X-RAY DIFFRACTION | x_bond_d_na | | X-RAY DIFFRACTION | x_bond_d_prot | | X-RAY DIFFRACTION | x_angle_d | | X-RAY DIFFRACTION | x_angle_d_na | | X-RAY DIFFRACTION | x_angle_d_prot | | X-RAY DIFFRACTION | x_angle_deg2.3 | | X-RAY DIFFRACTION | x_angle_deg_na | | X-RAY DIFFRACTION | x_angle_deg_prot | | X-RAY DIFFRACTION | x_dihedral_angle_d | | X-RAY DIFFRACTION | x_dihedral_angle_d_na | | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | | X-RAY DIFFRACTION | x_improper_angle_d | | X-RAY DIFFRACTION | x_improper_angle_d_na | | X-RAY DIFFRACTION | x_improper_angle_d_prot | | X-RAY DIFFRACTION | x_mcbond_it0.785 | 1.5 | X-RAY DIFFRACTION | x_mcangle_it1.425 | 2 | X-RAY DIFFRACTION | x_scbond_it0.799 | 2 | X-RAY DIFFRACTION | x_scangle_it1.401 | 2.5 | | | | | | | | | | | | | | | | | | | |
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精密化 | *PLUS Rfactor obs: 0.24 / Rfactor Rwork: 0.24 |
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溶媒の処理 | *PLUS |
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原子変位パラメータ | *PLUS Biso mean: 35.417 Å2 |
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拘束条件 | *PLUS Refine-ID | タイプ | Dev ideal target | Dev ideal |
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X-RAY DIFFRACTION | x_bond_d0.02 | | X-RAY DIFFRACTION | x_angle_d0.035 | 0.033 | X-RAY DIFFRACTION | x_angle_deg | | X-RAY DIFFRACTION | x_planar_d0.05 | 0.038 | X-RAY DIFFRACTION | x_plane_restr0.02 | 0.008 | X-RAY DIFFRACTION | x_chiral_restr0.15 | 0.146 | | | | | | |
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