ソフトウェア | 名称 | バージョン | 分類 |
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DENZO | | データ削減 | SCALEPACK | | データスケーリング | AMoRE | | 位相決定 | X-PLOR | 3.851 | 精密化 |
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精密化 | 構造決定の手法: 分子置換 開始モデル: PDB ENTRY 1HNG 解像度: 1.8→15 Å / Rfactor Rfree error: 0.006 / Isotropic thermal model: RESTRAINED / 交差検証法: THROUGHOUT / σ(F): 0
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.243 | 1785 | 5 % | RANDOM |
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Rwork | 0.2018 | - | - | - |
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obs | - | 35955 | 96.3 % | - |
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原子変位パラメータ | Biso mean: 33.9 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 1.56 Å2 | 2 Å2 | 0 Å2 |
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2- | - | 1.56 Å2 | 0 Å2 |
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3- | - | - | -3.12 Å2 |
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Refine analyze | | Free | Obs |
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Luzzati coordinate error | 0.29 Å | 0.25 Å |
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Luzzati d res low | - | 5 Å |
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Luzzati sigma a | 0.28 Å | 0.29 Å |
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精密化ステップ | サイクル: LAST / 解像度: 1.8→15 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 1398 | 0 | 42 | 197 | 1637 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target |
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X-RAY DIFFRACTION | x_bond_d0.011 | | X-RAY DIFFRACTION | x_bond_d_na | | X-RAY DIFFRACTION | x_bond_d_prot | | X-RAY DIFFRACTION | x_angle_d | | X-RAY DIFFRACTION | x_angle_d_na | | X-RAY DIFFRACTION | x_angle_d_prot | | X-RAY DIFFRACTION | x_angle_deg1.6 | | X-RAY DIFFRACTION | x_angle_deg_na | | X-RAY DIFFRACTION | x_angle_deg_prot | | X-RAY DIFFRACTION | x_dihedral_angle_d28.5 | | X-RAY DIFFRACTION | x_dihedral_angle_d_na | | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | | X-RAY DIFFRACTION | x_improper_angle_d0.88 | | X-RAY DIFFRACTION | x_improper_angle_d_na | | X-RAY DIFFRACTION | x_improper_angle_d_prot | | X-RAY DIFFRACTION | x_mcbond_it2.19 | 1.5 | X-RAY DIFFRACTION | x_mcangle_it3.71 | 2 | X-RAY DIFFRACTION | x_scbond_it3.7 | 2 | X-RAY DIFFRACTION | x_scangle_it5.86 | 2.5 | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 1.8→1.88 Å / Rfactor Rfree error: 0.021 / Total num. of bins used: 8
| Rfactor | 反射数 | %反射 |
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Rfree | 0.3452 | 193 | 4.7 % |
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Rwork | 0.3347 | 3902 | - |
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obs | - | - | 88.8 % |
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Xplor file | Refine-ID | Serial no | Param file | Topol file |
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X-RAY DIFFRACTION | 1 | PARHCSDX.PROTOPHCSDX.PROX-RAY DIFFRACTION | 2 | PARAM3.CHOTOPH3.CHOX-RAY DIFFRACTION | 3 | PARAM11.WATTOPH11.WAT | | | | | |
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ソフトウェア | *PLUS 名称: X-PLOR / バージョン: 3.851 / 分類: refinement |
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精密化 | *PLUS Rfactor Rwork: 0.202 |
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溶媒の処理 | *PLUS |
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原子変位パラメータ | *PLUS |
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拘束条件 | *PLUS Refine-ID | タイプ | Dev ideal |
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X-RAY DIFFRACTION | x_dihedral_angle_d | X-RAY DIFFRACTION | x_dihedral_angle_deg28.5 | X-RAY DIFFRACTION | x_improper_angle_d | X-RAY DIFFRACTION | x_improper_angle_deg0.88 | | | | |
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