| ソフトウェア | | 名称 | バージョン | 分類 |
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X-PLOR | 3.851 | 精密化 | | ソフトウェア | AT SYNCHROTRON| データ削減 | |
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| 精密化 | 構造決定の手法: 多重同系置換 / 解像度: 3→30 Å / 交差検証法: THROUGHOUT / σ(F): 2
| Rfactor | 反射数 | %反射 | Selection details |
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| Rfree | 0.251 | 573 | 10 % | RANDOM |
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| Rwork | 0.227 | - | - | - |
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| obs | 0.227 | 5739 | 98.2 % | - |
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| 精密化ステップ | サイクル: LAST / 解像度: 3→30 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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| 原子数 | 0 | 850 | 0 | 0 | 850 |
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| 拘束条件 | | Refine-ID | タイプ | Dev ideal |
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| X-RAY DIFFRACTION | x_bond_d| 0.01 | | X-RAY DIFFRACTION | x_bond_d_na | | X-RAY DIFFRACTION | x_bond_d_prot | | X-RAY DIFFRACTION | x_angle_d | | X-RAY DIFFRACTION | x_angle_d_na | | X-RAY DIFFRACTION | x_angle_d_prot | | X-RAY DIFFRACTION | x_angle_deg| 1.24 | | X-RAY DIFFRACTION | x_angle_deg_na | | X-RAY DIFFRACTION | x_angle_deg_prot | | X-RAY DIFFRACTION | x_dihedral_angle_d| 28.3 | | X-RAY DIFFRACTION | x_dihedral_angle_d_na | | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | | X-RAY DIFFRACTION | x_improper_angle_d | | X-RAY DIFFRACTION | x_improper_angle_d_na | | X-RAY DIFFRACTION | x_improper_angle_d_prot | | X-RAY DIFFRACTION | x_mcbond_it | | X-RAY DIFFRACTION | x_mcangle_it | | X-RAY DIFFRACTION | x_scbond_it | | X-RAY DIFFRACTION | x_scangle_it | | | | | | | | | | | | | | | | | | | |
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| LS精密化 シェル | 解像度: 3→3.14 Å / Total num. of bins used: 8 / | Rfactor | 反射数 | %反射 |
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| Rfree | 0.54 | 84 | 10 % |
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| Rwork | 0.48 | 588 | - |
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| Xplor file | Serial no: 1 / Param file: DNA-RNA-MULTI-END.PARAM / Topol file: TOP_NDBX3.DNA |
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| ソフトウェア | *PLUS 名称: X-PLOR / バージョン: 3.851 / 分類: refinement |
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| 拘束条件 | *PLUS | Refine-ID | タイプ | Dev ideal |
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| X-RAY DIFFRACTION | x_dihedral_angle_d | | X-RAY DIFFRACTION | x_dihedral_angle_deg| 28.3 | | |
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| LS精密化 シェル | *PLUS Rfactor Rfree: 0.54 / Rfactor Rwork: 0.48 |
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