| ソフトウェア | | 名称 | バージョン | 分類 |
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X-PLOR | 3.8 | モデル構築 | X-PLOR | 3.8 | 精密化 | | DENZO | | データ削減 | CCP4 | (SCALA)| データスケーリング | X-PLOR | 3.8 | 位相決定 | |
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| 精密化 | 構造決定の手法: 多波長異常分散 / 解像度: 1.8→6 Å / Data cutoff high absF: 10000000 / Data cutoff low absF: 0.001 / Isotropic thermal model: RESTRAINED INDIVIDUAL B'S / 交差検証法: THROUGHOUT / σ(F): 2
| Rfactor | 反射数 | %反射 | Selection details |
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| Rfree | 0.269 | 1004 | 10.9 % | RANDOM |
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| Rwork | 0.208 | - | - | - |
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| obs | 0.208 | 9134 | 99.2 % | - |
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| 原子変位パラメータ | Biso mean: 18.8 Å2 |
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| 精密化ステップ | サイクル: LAST / 解像度: 1.8→6 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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| 原子数 | 774 | 0 | 1 | 125 | 900 |
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| 拘束条件 | | Refine-ID | タイプ | Dev ideal | Dev ideal target |
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| X-RAY DIFFRACTION | x_bond_d| 0.004 | | | X-RAY DIFFRACTION | x_bond_d_na | | | X-RAY DIFFRACTION | x_bond_d_prot | | | X-RAY DIFFRACTION | x_angle_d | | | X-RAY DIFFRACTION | x_angle_d_na | | | X-RAY DIFFRACTION | x_angle_d_prot | | | X-RAY DIFFRACTION | x_angle_deg| 0.636 | | | X-RAY DIFFRACTION | x_angle_deg_na | | | X-RAY DIFFRACTION | x_angle_deg_prot | | | X-RAY DIFFRACTION | x_dihedral_angle_d| 16.4 | | | X-RAY DIFFRACTION | x_dihedral_angle_d_na | | | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | | | X-RAY DIFFRACTION | x_improper_angle_d| 0.5 | | | X-RAY DIFFRACTION | x_improper_angle_d_na | | | X-RAY DIFFRACTION | x_improper_angle_d_prot | | | X-RAY DIFFRACTION | x_mcbond_it| 1.7 | 1.5 | | X-RAY DIFFRACTION | x_mcangle_it| 2.36 | 2 | | X-RAY DIFFRACTION | x_scbond_it| 3.58 | 2 | | X-RAY DIFFRACTION | x_scangle_it| 5.949 | 2.5 | | | | | | | | | | | | | | | | | | | |
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| LS精密化 シェル | 解像度: 1.8→1.88 Å / Total num. of bins used: 8
| Rfactor | 反射数 | %反射 |
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| Rfree | 0.384 | 121 | 10.6 % |
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| Rwork | 0.307 | 984 | - |
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| obs | - | - | 97.1 % |
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| Xplor file | | Refine-ID | Serial no | Param file | Topol file |
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| X-RAY DIFFRACTION | 1 | PARHCSDX.PROTOPHCSDX.PRO| X-RAY DIFFRACTION | 2 | PROTEIN_REP.PARAM | | | |
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| ソフトウェア | *PLUS 名称: X-PLOR / バージョン: 3.8 / 分類: refinement |
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| 精密化 | *PLUS % reflection Rfree: 10 % |
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| 溶媒の処理 | *PLUS |
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| 原子変位パラメータ | *PLUS |
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| 拘束条件 | *PLUS | Refine-ID | タイプ | Dev ideal |
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| X-RAY DIFFRACTION | x_dihedral_angle_d | | X-RAY DIFFRACTION | x_dihedral_angle_deg| 16.4 | | X-RAY DIFFRACTION | x_improper_angle_d | | X-RAY DIFFRACTION | x_improper_angle_deg| 0.5 | | | | |
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| LS精密化 シェル | *PLUS Rfactor obs: 0.307 |
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