ソフトウェア | 名称 | バージョン | 分類 |
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X-PLOR | 3.851 | モデル構築 | X-PLOR | 3.851 | 精密化 | PROCESS | (HIGASHI)データ削減 | PROCESS | (HIGASHI)データスケーリング | X-PLOR | 3.851 | 位相決定 | | |
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精密化 | 構造決定の手法: MOLECULAR REPLACEMENT MOLECULAR REPLACEMENT 開始モデル: PDB ENTRY 1NUL 解像度: 2.25→50 Å / Rfactor Rfree error: 0.009 / Data cutoff high absF: 100000 / Data cutoff low absF: 1 / Isotropic thermal model: RESTRAINED / 交差検証法: THROUGHOUT / σ(F): 0 / 詳細: BULK SOLVENT MODEL USED
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.224 | 573 | 5.2 % | RANDOM |
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Rwork | 0.21 | - | - | - |
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obs | 0.21 | 11083 | 79.4 % | - |
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原子変位パラメータ | Biso mean: 36.1 Å2 |
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Refine analyze | | Free | Obs |
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Luzzati coordinate error | 0.32 Å | 0.28 Å |
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Luzzati d res low | - | 5 Å |
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Luzzati sigma a | 0.38 Å | 0.35 Å |
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精密化ステップ | サイクル: LAST / 解像度: 2.25→50 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 1900 | 0 | 0 | 66 | 1966 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target |
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X-RAY DIFFRACTION | x_bond_d0.005 | | X-RAY DIFFRACTION | x_bond_d_na | | X-RAY DIFFRACTION | x_bond_d_prot | | X-RAY DIFFRACTION | x_angle_d | | X-RAY DIFFRACTION | x_angle_d_na | | X-RAY DIFFRACTION | x_angle_d_prot | | X-RAY DIFFRACTION | x_angle_deg1.1 | | X-RAY DIFFRACTION | x_angle_deg_na | | X-RAY DIFFRACTION | x_angle_deg_prot | | X-RAY DIFFRACTION | x_dihedral_angle_d23.7 | | X-RAY DIFFRACTION | x_dihedral_angle_d_na | | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | | X-RAY DIFFRACTION | x_improper_angle_d1.02 | | X-RAY DIFFRACTION | x_improper_angle_d_na | | X-RAY DIFFRACTION | x_improper_angle_d_prot | | X-RAY DIFFRACTION | x_mcbond_it1.44 | 1.5 | X-RAY DIFFRACTION | x_mcangle_it2.53 | 2 | X-RAY DIFFRACTION | x_scbond_it1.84 | 2 | X-RAY DIFFRACTION | x_scangle_it2.85 | 2.5 | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 2.25→2.39 Å / Rfactor Rfree error: 0.038 / Total num. of bins used: 6
| Rfactor | 反射数 | %反射 |
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Rfree | 0.326 | 73 | 4.6 % |
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Rwork | 0.308 | 1520 | - |
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obs | - | - | 68 % |
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Xplor file | Refine-ID | Serial no | Param file | Topol file |
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X-RAY DIFFRACTION | 1 | PARHCSDX.PROTOPHCSDX.PROX-RAY DIFFRACTION | 2 | PARAM19.SOLTOPH19.SOLX-RAY DIFFRACTION | 3 | CIS_PEP.PARCIS_PEP.TOP | | | | | |
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精密化 | *PLUS % reflection Rfree: 10 % / Rfactor obs: 0.21 / Rfactor Rfree: 0.224 / Rfactor Rwork: 0.21 |
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溶媒の処理 | *PLUS |
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原子変位パラメータ | *PLUS |
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拘束条件 | *PLUS Refine-ID | タイプ | Dev ideal |
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X-RAY DIFFRACTION | x_angle_deg1.075 | X-RAY DIFFRACTION | x_dihedral_angle_d | X-RAY DIFFRACTION | x_dihedral_angle_deg23.7 | X-RAY DIFFRACTION | x_improper_angle_d | X-RAY DIFFRACTION | x_improper_angle_deg1.02 | | | | | |
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LS精密化 シェル | *PLUS Rfactor Rfree: 0.326 / Rfactor Rwork: 0.308 |
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