解像度: 3.1→46.94 Å / Cor.coef. Fo:Fc: 0.867 / Cor.coef. Fo:Fc free: 0.832 / Rfactor Rfree error: 0 / SU R Cruickshank DPI: 0.834 / 交差検証法: THROUGHOUT / σ(F): 0 / SU R Blow DPI: 0.714 / SU Rfree Blow DPI: 0.374 / SU Rfree Cruickshank DPI: 0.391 詳細: THERE ARE SOME UNKNOWN DENSITIES LOCATED ABOVE THE LIGAND BINDING SITE AND NEAR THE TRP222 ON BOTH A AND B CHAINS. THEY HAVE NOT BEEN MODELLED.
Rfactor
反射数
%反射
Selection details
Rfree
0.275
1505
4.97 %
RANDOM
Rwork
0.254
-
-
-
obs
0.255
30255
93.5 %
-
原子変位パラメータ
Biso mean: 85.74 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-29.6548 Å2
0 Å2
-3.2357 Å2
2-
-
21.5032 Å2
0 Å2
3-
-
-
8.1516 Å2
Refine analyze
Luzzati coordinate error obs: 0.6 Å
精密化ステップ
サイクル: 1 / 解像度: 3.1→46.94 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
6006
0
136
0
6142
拘束条件
Refine-ID
タイプ
Dev ideal
数
Restraint function
Weight
X-RAY DIFFRACTION
t_bond_d
0.01
6307
HARMONIC
2
X-RAY DIFFRACTION
t_angle_deg
0.95
8661
HARMONIC
2
X-RAY DIFFRACTION
t_dihedral_angle_d
2728
SINUSOIDAL
15
X-RAY DIFFRACTION
t_incorr_chiral_ct
X-RAY DIFFRACTION
t_pseud_angle
X-RAY DIFFRACTION
t_trig_c_planes
81
HARMONIC
2
X-RAY DIFFRACTION
t_gen_planes
931
HARMONIC
5
X-RAY DIFFRACTION
t_it
6307
HARMONIC
20
X-RAY DIFFRACTION
t_nbd
X-RAY DIFFRACTION
t_omega_torsion
2.54
X-RAY DIFFRACTION
t_other_torsion
1.57
X-RAY DIFFRACTION
t_improper_torsion
X-RAY DIFFRACTION
t_chiral_improper_torsion
901
SEMIHARMONIC
5
X-RAY DIFFRACTION
t_sum_occupancies
X-RAY DIFFRACTION
t_utility_distance
X-RAY DIFFRACTION
t_utility_angle
X-RAY DIFFRACTION
t_utility_torsion
X-RAY DIFFRACTION
t_ideal_dist_contact
7781
SEMIHARMONIC
4
LS精密化 シェル
解像度: 3.1→3.21 Å / Rfactor Rfree error: 0 / Total num. of bins used: 15