解像度: 1.55→45.06 Å / Cor.coef. Fo:Fc: 0.967 / Cor.coef. Fo:Fc free: 0.953 / SU B: 3.087 / SU ML: 0.051 / 交差検証法: THROUGHOUT / ESU R: 0.081 / ESU R Free: 0.079 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.18858
1852
5 %
RANDOM
Rwork
0.16507
-
-
-
obs
0.16629
35403
96.63 %
-
all
-
38549
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 21.966 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.3 Å2
0 Å2
0.71 Å2
2-
-
-0.11 Å2
0 Å2
3-
-
-
0.62 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.55→45.06 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2043
0
33
295
2371
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.008
0.019
2173
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
2097
X-RAY DIFFRACTION
r_angle_refined_deg
1.325
1.983
2945
X-RAY DIFFRACTION
r_angle_other_deg
0.781
3.001
4828
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.128
5
251
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
31.587
23.232
99
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
11.054
15
398
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
16.305
15
19
X-RAY DIFFRACTION
r_chiral_restr
0.076
0.2
327
X-RAY DIFFRACTION
r_gen_planes_refined
0.005
0.021
2369
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
495
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
X-RAY DIFFRACTION
r_scbond_it
X-RAY DIFFRACTION
r_scangle_it
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.55→1.59 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.239
85
-
Rwork
0.232
1873
-
obs
-
-
68.8 %
精密化 TLS
手法: refined / Origin x: 9.774 Å / Origin y: -0.0336 Å / Origin z: 14.9842 Å