プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 0.97 Å / 相対比: 1
反射
解像度: 1.83→15 Å / Num. obs: 30761 / % possible obs: 97.7 % / 冗長度: 2.9 % / Biso Wilson estimate: 18.357 Å2 / Rsym value: 0.047 / Net I/σ(I): 16
反射 シェル
解像度: 1.83→1.86 Å / 冗長度: 2.7 % / Mean I/σ(I) obs: 4.3 / Rsym value: 0.17 / % possible all: 96.9
反射
*PLUS
Rmerge(I) obs: 0.051
反射 シェル
*PLUS
Rmerge(I) obs: 0.151
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解析
ソフトウェア
名称
分類
REFMAC
精密化
DENZO
データ削減
SCALEPACK
データスケーリング
精密化
構造決定の手法: OTHER / 解像度: 1.83→8 Å / SU B: 3.14 / SU ML: 0.096 / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.143 / ESU R Free: 0.144 詳細: N-TERMINUS FROM RESIDUE 1 TO 8, IN SUBUNIT A AND 1 - 10 IN SUBUNIT B, ARE NOT VISIBLE IN THE ELECTRON DENSITY, DUE TO FLEXIBILITY. ALTERNATE POSITIONS ARE PRESENT FOR SIDE CHAIN OF RESIDUES ...詳細: N-TERMINUS FROM RESIDUE 1 TO 8, IN SUBUNIT A AND 1 - 10 IN SUBUNIT B, ARE NOT VISIBLE IN THE ELECTRON DENSITY, DUE TO FLEXIBILITY. ALTERNATE POSITIONS ARE PRESENT FOR SIDE CHAIN OF RESIDUES 19A, 39A, 57A, 79A, 87 A, 95A, 98A, 114A, 129A, 133A, 147 A, 19B, 52B, 53B, 77 B, 89 B, 114B, 143B. THE ATOMS CONCERNED HAVE OCCUPANCY BETWEEN 0.0 AND 1.0 AND A SEGID AC1 AND AC2 OFTEN, OCCUPANCY VALUES LOWER THAN 1.0 APPEARED TO JUSTIFY BETTER THE ELECTRON DENSITY. FOR THIS REASON WE HAVE KEPT THIS LOW OCCUPANCY FOR SEVERAL SIDE CHAIN ATOMS.