Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 24-ID-E |
Synchrotron site | APS |
Beamline | 24-ID-E |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2017-03-15 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 0.97918 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 27.898, 44.047, 133.954 |
Unit cell angles | 90.00, 94.59, 90.00 |
Refinement procedure
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 100.000 | 2.010 |
High resolution limit [Å] | 1.975 | 1.975 |
Rmerge | 0.099 | 0.209 |
Number of reflections | 22984 | 1134 |
<I/σ(I)> | 13.425 | 9.44 |
Completeness [%] | 98.0 | 97.4 |
Redundancy | 4.9 | 4.3 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 7.5 | 277 | 0.1 M HEPES pH7.5 0.2 M NaOAc 20% PEG 3000 |