6IQK
crystal structure of Arabidopsis thaliana Profilin 3
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | NSLS BEAMLINE X17B1 |
Synchrotron site | NSLS |
Beamline | X17B1 |
Temperature [K] | 77 |
Detector technology | PIXEL |
Collection date | 2017-12-03 |
Detector | DECTRIS PILATUS 300K |
Wavelength(s) | 0.98 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 135.900, 153.370, 196.680 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 49.240 - 3.600 |
R-factor | 0.3128 |
Rwork | 0.309 |
R-free | 0.34650 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.002 |
RMSD bond angle | 0.549 |
Data reduction software | XDS |
Data scaling software | XDS |
Phasing software | PHASER |
Refinement software | PHENIX (1.16_3549) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 49.240 | 3.729 |
High resolution limit [Å] | 3.600 | 3.600 |
Number of reflections | 48279 | 48279 |
<I/σ(I)> | 6 | |
Completeness [%] | 99.8 | |
Redundancy | 15 | |
CC(1/2) | 0.991 | 0.275 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | EVAPORATION | 293 | 0.1M Tris HCl (pH 7.8), 0.9M sodium citrate |