6G2E
X-ray structure of NSD3-PWWP1 in complex with compound 13
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2016-04-22 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 1.000 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 44.247, 47.532, 63.444 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 38.040 - 1.850 |
R-factor | 0.211 |
Rwork | 0.209 |
R-free | 0.25200 |
RMSD bond length | 0.008 |
RMSD bond angle | 0.890 |
Data reduction software | XDS |
Data scaling software | Aimless |
Phasing software | BALBES |
Refinement software | BUSTER (2.11.7) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 63.440 | 1.854 |
High resolution limit [Å] | 1.848 | 1.848 |
Rmerge | 0.057 | 0.977 |
Rmeas | 0.062 | 1.123 |
Rpim | 0.020 | 0.357 |
Number of reflections | 11914 | |
<I/σ(I)> | 19.5 | |
Completeness [%] | 100.0 | |
Redundancy | 9.7 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 277 | 100mM Morpheus Buffer 3, 30% P550MME_P20K, 10% Morpheus Ethylene glycols |