5EBM
KcsA T75G mutant in the nonconductive state
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | ALS BEAMLINE 4.2.2 |
Synchrotron site | ALS |
Beamline | 4.2.2 |
Temperature [K] | 80 |
Detector technology | CMOS |
Collection date | 2015-03-10 |
Detector | RDI CMOS_8M |
Wavelength(s) | 1.0 |
Spacegroup name | I 4 |
Unit cell lengths | 155.720, 155.720, 75.556 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 42.783 - 2.500 |
R-factor | 0.2194 |
Rwork | 0.216 |
R-free | 0.25120 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 1k4c |
RMSD bond length | 0.003 |
RMSD bond angle | 0.582 |
Data reduction software | XDS |
Data scaling software | XDS |
Phasing software | PHASER |
Refinement software | PHENIX (1.8_1069) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 55.054 | 55.054 | 2.640 |
High resolution limit [Å] | 2.500 | 7.910 | 2.500 |
Rmerge | 0.085 | 0.027 | 1.124 |
Rmeas | 0.092 | ||
Rpim | 0.035 | 0.011 | 0.493 |
Total number of observations | 219611 | 7405 | 28317 |
Number of reflections | 31464 | ||
<I/σ(I)> | 15.6 | 51.4 | 1.5 |
Completeness [%] | 100.0 | 99.4 | 100 |
Redundancy | 7 | 7.1 | 6.2 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 291 | PEG 400 |